Lg Electronics Inc.

Samsung Electronics Co., Ltd.

Lg Micron Ltd.

Ki-Won Park

Hyouk Chon Kwon

Young-Joo Yee

Chang-hoon Oh

Dong-Mug Seong

Gun-Woo Lee

Tae-Sun Lim

Hong-Sun Hwang

Sung-Ryul Kim

Byung-sik Moon

Dong-Hak Shin

Hae-Jin Oh

A scroll compressor is provided with a buffer portion () having an increased diameter at an intermediate part of a discharge port (). A refrigerant discharged from compression chambers (p) is introduced into the buffer portion (), and temporarily stays thereat. Then, the refrigerant is discharged to a discharge plenum (), thereby reducing a pulsating pressure. Accordingly, noise occurring when the refrigerant discharged from the compression chambers (p) collides with the discharge plenum () is reduced, thereby greatly reducing noise of the scroll compressor.

Scroll compressor

Disclosed herein are a microlens array sheet having a black matrix and a method for manufacturing the same. The manufacturing method includes a) the step of defining the regions of light apertures, through which condensed light passes, in a negative-type light-sensitive resin layer by radiating and condensing parallel light after sequentially laying a microlens array layer, a transparent support substrate or film layer and the negative-type light-sensitive resin layer one on top of another, and b) eliminating portions other than the regions of the light apertures formed in the light-sensitive resin layer, and forming a black matrix layer in regions where the portions have been eliminated.

Microlens array sheet having black matrix and method of manufacturing the same

A full-stress testable memory device having an open bit line architecture and a method of testing the memory device. The memory device of the invention includes dummy bit lines, and a voltage controller connected to the dummy bit lines. The voltage controller alternately provides a first variable control voltage and a second variable control voltage to the dummy bit lines during a test mode. In accordance with a method of testing the memory device, a fixed voltage is provided to the dummy bit lines of the edge sub-arrays during a normal operation mode. However, during a test mode, the fixed voltage being applied to the dummy bit line is replaced with a supply voltage and/or a ground voltage, so that all of the sub-arrays can be equally tested.

Full-stress testable memory device having an open bit line architecture and method of testing the same

A semiconductor memory device may include a switching unit to selectively connect a bitline pair and a pair of input/output lines in response to a column selection line signal; a column selection line voltage generator to generate a column selection line voltage; and a column selection line driver to provide the column selection line signal based at least in at the column selection line voltage level.

Semiconductor memory device

A microlens array sheet and a manufacturing method thereof. The microlens array sheet comprises: a transparent substrate; bases formed on the transparent substrate, the bases having the same height as a result of a planarization process conducted for the upper portions of the bases, microlenses formed on the bases; and a gap-filling film applied on the resulting structure, in which the bases have the same height. The method comprises the steps of: depositing base-forming molds on a transparent support substrate or film and loading a material to be used as bases between the base-forming molds; polishing the upper portion of the material for use as bases so as to form bases having the same level, and removing the base-forming molds; depositing microlenses on the formed bases; and depositing a gap-filling film on the resulting structure.

Microlens array sheet and manufacturing method thereof

The present invention discloses a microlens array sheet of a projection screen including a lens sheet having a predetermined area, microlenses arranged on one surface of the lens sheet in the horizontal and vertical directions, a black matrix including apertures corresponding to the microlenses, and being adhered to the other surface of the lens sheet, an optical diffusing layer formed on the lens sheet to cover the black matrix, for widening a viewing angle, and a protecting film for protecting the optical diffusing layer. The microlens array sheet of the projection screen is manufactured by using a process for manufacturing a semiconductor device, a reflow process and a plating process for a mold, thereby improving luminance and definition of the projection screen at a low unit cost of production.

Microlens array sheet of projection screen, and method for manufacturing the same

A memory device having an open bit line cell structure uses a wafer burn-in testing scheme and a method for testing the same. The memory device includes a sense amplifier having first and second input terminals; a bit line connected to the first input terminal of the sense amplifier and extended in a first direction; an inverted bit line connected to the second input terminal of the sense amplifier and extended in a second direction; and a voltage supply means for applying the same voltage to the bit line and the inverted bit line in a precharge operation mode and applying a different level voltage to the bit line and the inverted bit line in a burn-in test operation mode. It is possible to efficiently screen defects of memory cells and between bit lines by performing a wafer burn-in test using a wafer burn-in scheme on a memory device having an open bit line cell structure.

Memory device having open bit line cell structure using burn-in testing scheme and method therefor

An oil supply device of a scroll compressor includes a pumping unit mounted at a lower side of a rotating shaft and pumping oil stored at a lower portion of a casing according to rotation of the rotating shaft; an oil supply passage formed in a longitudinal direction of the rotating shaft and supplying oil pumped by the pumping unit to each friction portion; an oil channel formed at an upper surface of the main frame and connecting an oil groove formed at the upper surface of the main frame and a pocket formed at the center of the main frame; and an oil guide recess formed to connect the oil groove and the key hole formed at the main frame and guiding oil introduced into the oil groove to the key hole. By supplying oil to the key hole, abrasion between an oldhamring key and the key hold is prevented and noise is reduced, enhancing reliability of the compressor.

Growing community of inventors

Gyeonggi-do, South Korea

Ki-Won Park