Intel Corporation

Ki W Yoon

Lakshminarayana Pappu

Michael T Klinglesmith

Tsvika Kurts

Kevin Safford

Robert L Farrell

Robert P Adler

Larisa Novakovsky

Yoni Aizik

Hisham Shafi

Hermann Gartler

Robert De Gruijl

Mitchell Diamond

David B Jackson

Michael J St Clair

William Penner

Ricardo Allen

Mohammad A Abadallah

Kip A Baumann

Rafi M Saied

Chai Ziv

In one embodiment, an apparatus includes multiple die and at least one interconnect to couple the die. A first die includes one or more cores, a first fabric and a first fabric transactor coupled to the first fabric, the first fabric transactor to initiate a functional test of the apparatus in response to a test signal, cause at least one first test transaction to be sent to a second die, receive a first response to the at least one first test transaction from the second die, and identify, based at least in part on the first response to the at least one test transaction, a location of a failure and report the location of the failure to a destination. Other embodiments are described and claimed.

System, apparatus and method for inter-die functional testing of an integrated circuit

Embodiment of this disclosure provides a mechanism to support hang detection and data recovery in microprocessor systems. In one embodiment, a processing device comprising a processing core and a crashlog unit operatively coupled to the core is provided. An indication of an unresponsive state in an execution of a pending instruction by the core is received. Responsive to receiving the indication, a crash log comprising data from registers of at least one of: a core region, a non-core region and a controller hub associated with the processing device is produced. Thereupon, the crash log is stored in a shared memory of a power management controller (PMC) associated with the controller hub.

Supporting hang detection and data recovery in microprocessor systems

A fabric trace hook is disclosed to enable debugging operations of agents operating in a peer-to-peer integrated on-chip system fabric. The fabric trace hook, embedded within the IOSF, includes programmable triggering and capturing logic, timestamp capability, and a security feature to disallow tracing of proprietary transactions. The fabric trace hook may operate in a lossy or lossless mode.

Method and apparatus to trigger and trace on-chip system fabric transactions within the primary scalable fabric

Embodiments of an invention using cached dirty bits for context switch consistency checks are disclosed. In one embodiment, a processor includes control logic and a cache. The control logic is to cause a consistency check to be performed on a subset of a plurality of state components during a first context switch. The cache is to store a dirty entry for each state component to indicate whether the corresponding state component is included in the subset.

Cached dirty bits for context switch consistency checks

Techniques for control word prediction and speculative execution. In one embodiment, an apparatus includes a control word predictor, execution resources, and a comparison module. The control word predictor of this embodiment predicts a predicted control word for execution of operations in response to a control word changing operation. The execution resources of this embodiment speculatively execute the plurality of operations utilizing the predicted control word, and the comparison module determines if the predicted control word matches an actual control word set by the control word changing operation or a plurality of other control words, and to cause re-execution of said plurality of operations if said actual control word matches any of the plurality of other control words.

Control word prediction and varying recovery upon comparing actual to set of stored words

Growing community of inventors

El Dorado Hills, CA, United States of America

Ki W Yoon