Korea Basic Science Institute

Gwangju Institute of Science and Technology

Institute for Basic Science

Ki Soo Chang

Geon Hee Kim

Dong Uk Kim

Kye Sung Lee

Sun Cheol Yang

Sun Choel Yang

Seon Young Ryu

Hyo Sik Kim

Ji Yong Bae

I Jong Kim

Myeong Sang Kim

Sang Yong Lee

Hae Young Choi

Chang Hee Nam

Hwan Hur

Hong Seung Kim

Il Woo Choi

Sang Hyeok Kim

Joo Ran Lee

Gun Hee Kim

Ha Yeong Sung

Woo June Choi

Woo Kang Kim

Ki Ju Yee

Dong Ik Kim

Ghi Seok Kim

Cheonha Jeon

Jung Dae Kim

A spiral phase plate, according to one embodiment, for generating a Laguerre Gaussian beam by reflecting an incident beam emitted from a light source, may comprise: a first quadrant area in which the step height increase rate per unit angle decreases progressively in one direction from the point with the lowest step height to the point with the highest step height; and a second quadrant area in which the step height increase rate per unit angle increases progressively in the one direction.

Reflective spiral phase plate, and apparatus for generating Laguerre Gaussian beam comprising same

Disclosed are a multi-mode thermal imaging device and an operation method thereof. According to an embodiment of the present invention, in a first mode, a first sample is scanned with an optical signal from a light source, signals reflected from the first sample by the scanning are detected separately for each wavelength, a reflectance change spectrum according to the wavelength is derived on the basis of the signals detected separately for each wavelength, a wavelength is selected on the basis of the derived reflectance change spectrum, and a thermal image of the first sample is obtained, through a filter, by detecting an optical signal limited to the selected wavelength from among the signals reflected from the first sample. In a second mode, thermal radiation of a second sample is detected to obtain a thermal image of the second sample.

Multi-mode thermal imaging device and operation method thereof

Disclosed is a broadband objective lens and a method of manufacturing the objective lens. The objective lens includes a plurality of lenses, and each of the lenses includes a coating layer on which a nanopattern is formed.

Broadband objective lens with anti-reflective nanoparticles and manufacturing method thereof

Provided is a fast parallel optical coherence tomographic image generating method including dispersing light into N spectral regions &#x394;&#x3bb;through &#x394;&#x3bb;sequentially from a low frequency wavelength to a high frequency wavelength, the light being emitted from a broadband light source of a fast parallel optical coherence tomographic image generating apparatus, N being an integer greater than or equal to 2, splitting the light emitted from the broadband light source to be incident on a sample and a reference mirror, partitioning the sample into N image regions Pthrough P, discretely controlling a beam scanner such that the light emitted from the broadband light source is incident on the sample at a position changed by a preset distance, acquiring an interference spectral image through interference light formed in response to interference of measurement light and reference light, and generating a tomographic image of the sample using the interference spectral image.

Fast parallel optical coherence tomographic image generating apparatus and method

Disclosed is a laser scanning based microscope apparatus including a light source configured to output a laser signal, a scanning unit configured to scan a heating sample with a first laser signal corresponding to a portion of the output laser signal, and output an optical signal reflected from the sample by the scanning to a first detector, the first detector configured to generate a first electrical signal through the reflected optical signal, a second detector configured to generate a second electrical signal through a second laser signal corresponding to a remaining portion of the output laser signal, and a controller configured to acquire a thermal image of the sample by performing a frequency domain analysis based on the first electrical signal and a differential electrical signal.

Microscope apparatus based on laser scanning and operating method thereof

Provided is a fluorescence image acquisition apparatus for acquiring fluorescence images and phase images using optical signals that are modulated at the same frequency and that have different time delays. The fluorescence image acquisition apparatus may include a light source configured to generate, at different time delays, a plurality of optical signals that are modulated at the same frequency, an illuminator configured to control paths of the plurality of modulated optical signals so that the plurality of modulated optical signals are illuminated onto a sample including a plurality of fluorescent materials, a photodetector configured to detect a plurality of fluorescence signals that are emitted from the plurality of fluorescent materials, respectively, and a controller configured to acquire a plurality of fluorescence images and a plurality of phase images from the plurality of detected fluorescence signals.

Apparatus and method for acquiring fluorescence image

Provided is a solid immersion lens (SIL) holder for optical axis precision correction of a high resolution optical microscope, equipped with a SIL and an objective lens barrel equipped with a plurality of objective lenses, the SIL holder comprising: a circular flange providing in the middle of the objective lens barrel to be coupled to the SIL holder; a coupling flange formed at one end portion thereof and coupled to the circular flange; a conical tube formed at the other end portion thereof, the SIL being mounted onto a lower end portion of the conical tube, wherein the SIL holder comprises an optical axis adjusting part which adjusts such that the central axis of the SIL approaches the central axis of an objective lens, and the SIL holder comprises an extension/contraction adjusting part which allows the SIL to be very close to a measurement surface of a specimen.

Solid immersion lens holder for high resolution optical microscope

Disclosed is a temperature distribution measuring device for measuring the temperature distribution or the heat generation distribution in a sample. An embodiment collects a reflection signal the reflectivity of which changes on the basis of a bias signal applied to a sample, detects a signal of interest, which has been reflected from a region of interest in the sample, from the reflected signal, converts the signal of interest to a frequency range signal, calculates the relative amount of change in reflectivity of the sample by using a direct current component extracted on the basis of filtering of the frequency range signal and a frequency component of the bias signal, and acquires a thermal image of the sample on the basis of the relative amount of change in reflectivity.

Temperature distribution measuring apparatus and method

Provided is a common-path optical fiber-based handheld parallel optical coherence tomography (OCT) apparatus, including a probe configured to receive the light from a broadband light source and illuminate a measurement target, wherein the probe may include an inner space through which the light passes, a collimator configured to collimate the light incident to the inner space, a diffraction grating configured to diffract the light having passed through the collimator, a galvanometer scanner configured to reflect the light having passed through the diffraction grating, an objective lens configured to concentrate the reflected light on a focal point, and an interferer configured to acquire an interfered light by reflecting at least a portion of the light having passed through the objective lens.

Common-path optical fiber-based handheld parallel optical coherence tomography (OCT) apparatus

The present invention provides a method for analyzing defects by using heat distribution measurement, comprising: a sample loading unit for loading a sample to check whether or not there is a defect through heat distribution characteristics; a light source for radiating visible light onto the sample; a power supply unit for generating a driving signal in order to periodically heat the sample; a detection unit for detecting reflected light from the surface of the sample; and a signal generator for synchronizing the detection unit with the driving signal of the power supply unit.

Apparatus and method for analyzing defects by using heat distribution measurement

The present invention pertains to a device for measuring a temperature distribution, which can measure a temperature distribution without contacting a minor sample having a three-dimensional structure. More particularly, the device for measuring the temperature distribution can measure a three-dimensional temperature distribution for a sample, wherein the temperature distribution in a depth direction (direction z) of the sample is measured by a thermo-reflectance technique using a chromatic dispersion lens, a diffraction spectrometer and an optical detection array; and the temperature distribution in parallel directions (direction x-y axes) of the sample is measured by the thermo-reflectance technique using a biaxial scanning mirror.

Device for measuring temperature distribution

Provided is an apparatus for fixing a solid immersion lens (SIL) in an optical system. The apparatus includes a first adapter; a second adapter screw-coupled to the inner surface of the first adapter and screw-coupled to the outer surface of a third adapter to pressurize a first O-ring; the third adapter screw-coupled to the inner surfaces of the second adapter and a fourth adapter; the fourth adapter screw-coupled to the outer surface of the third adapter to pressurize a second O-ring; the first and second O-rings elastically fixing an outer surface of a barrel of an infrared ray (IR) objective lens; and an SIL holder mounting the SIL onto the first adapter.

Apparatus for fixing solid immersion lens

The present invention relates to a jig for processing the inner surface of an aluminum alloy Winston cone baffle having the thickness of a sheet through an ultra-precision machining, the jig having a shape identically corresponding to the outer shape of a Winston cone baffle having a can body shape made up of compound parabolic, and divided into an upper plate jig and a lower plate jig in formation, wherein the upper plate jig is divided in two, a left side jig and a right side jig, which are formed to correspond in shape and size so as to enable isolation or coupling to/from each other, and the inner surface of the Winston cone baffle attached inside the upper plate jig is made to enable ultra-precision machining at the cutting speed of 220 m/min-300 m/min, which enables the inner surface of the Winston cone baffle to process a slickenside having approximately 4 nm of surface roughness, and in particular, ultra-precision machining at surface roughness of Ra=2.32 nm in a processing condition of cutting speed at 260 m/min, cutting depth at 4 micrometer, and feeding speed at 1 mm/min, thereby enabling formation of a Winston cone baffle through low-cost ultra-precision machining.

Jig for Winston cone baffle machining

Surface measurement data just provides the coordinates of an object surface without giving various parameters like the radius of curvature, conic constant, and deformation coefficients. In this paper, we propose a novel method for extracting the important parameters for the determination of unknown aspheric surface equations from the measurement of aspheric surfaces. The largest error between the original surface and the reconstructed surface in the theoretical case is shown to be about 8.6 nm. This fact implies that the new method is well suited for the reconstruction of unknown surface equations.

Method of reconstructing aspheric surface equations from measurements

The present invention relates to an image sensor comprising a microlens array, and to a manufacturing method thereof. The method of the present invention includes gradually increasing the aluminum composition ratio of a compound semiconductor as the latter gradually gets farther from a substrate, to enable a microlens-forming layer to grow, and making the oxidation rate of the region adjacent to the substrate slower and the oxidation rate of the region farther from the substrate faster, making the interface between the oxidized region and the unoxidized region into a lens shape after the completion of oxidation. The thus-made lens is integrated into an image sensor. The present invention reduces costs for manufacturing image sensors in which a microlens is integrated, increases the signal-to-noise ratio and resolution of the image sensor, and achieves improved sensitivity.

Growing community of inventors

Daejeon, South Korea

Ki Soo Chang