Korea Electronics Technology Institute

Ki Man Jeon

Jae Gi Son

Chang Won Park

Min Ho Lee

Woo Kyeong Seong

Kook Nyung Lee

Young Chang Jo

Suk Won Jung

Hyuck Ki Hong

Sung Ju Park

Yeon Shik Choi

Hyun Woo Kim

Young Hwan Kim

Tae Sik Kim

Kyeong Won Yeom

Hyun Bean Yi

A method for managing AI components installed in containers is provided. The container-based component management method creates a container, installs at least one selected from a plurality of components in the container, and manages the components installed in the container. Accordingly, the execution priorities of the AI components installed in the containers can be managed and operated, such that degradation of system performance and frequent error occurrence can be prevented.

Container-based management method by changing intelligent container component execution priority using remote calls via remote access unit and remote network functon module

Disclosed is an image sensor using a nanowire, including a substrate, a photodetector for sensing incident light to produce photocurrent, the magnitude of which varies depending on the intensity of incident light, a signal processing module for outputting photodetection current including information about the presence or absence of incident light and the intensity of incident light based on the presence or absence of photocurrent and the magnitude thereof, and an electrode configured to electrically connect the photodetector and the signal processing module to each other and formed on the photodetector and the signal processing module, wherein the photodetector and the signal processing module are formed on the substrate, and the photodetector is formed of at least one silicon nanowire.

Image sensor using nanowire and method of manufacturing the same

Disclosed is an avalanche photodiode using a silicon nanowire, including a first silicon nanowire formed of silicon (Si), a first conductive region formed by doping one surface of the first silicon nanowire with a first dopant, and a second conductive region formed by doping one surface of the first silicon nanowire with a second dopant having a conductive type different from that of the first dopant so as to be arranged continuously in a longitudinal direction from the first conductive region, wherein, when the magnitude of a reverse voltage applied to both ends of the first silicon nanowire is equal to or greater than a preset breakdown voltage, avalanche multiplication of inner current occurs due to the incidence of light from the outside.

Avalanche photodiode using silicon nanowire and silicon nanowire photomultiplier using the same

A selective service providing method using a selective service module, and a home gateway using the same are provided. A home gateway includes a module port for mounting a service module which provides a particular service; a communication interface for receiving a function result of the service module mounted to the module port; a display interface connected with a display; and a processor for sending the function result received from the service module through the communication interface, to the display through the display interface. Thus, the user's intended service can be selectively provided using the selective service module.

Method for providing selective service by selective service module and home gateway using the same

An interconnect delay fault test controller and a test apparatus using the same wherein an update operation and a capture operation may be carried out in one interval of a system clock or a core clock when carrying out an interconnect delay fault test between an IEEE P1500 wrapped cores in a SoC as well as an interconnect wire on a board based on an IEEE 1149.1, and wherein the interconnect delay fault test using different system clocks or core clocks may be carried out simultaneously in one test cycle corresponding to each system clock or core clock even when multiple system clocks or core clocks exists is disclosed.

Interconnect delay fault test controller and test apparatus using the same

Disclosed herein is an SoC-based core scan chain linkage switch. The core scan chain linkage switch includes test bus terminals, scan chain input/output terminals, a switch unit and SCLK, UCLK, Mode and Enable signals. The test bus terminals apply instructions and input/output test data. The scan chain input/output terminals link with the scan chains of an embedded core. The switch unit completes a linkage configuration between the test bus terminals and the scan chain input/output terminals in response to the applied instructions. The SCLK, UCLK and Mode signals apply the instructions to dynamically reconfigure the switch unit and update the linkage configuration of the switch unit, and the Enable signal activates and deactivates the switch unit.

Growing community of inventors

Seongnam-si, South Korea

Ki Man Jeon