Samsung Electronics Co., Ltd.

Ki-hwan Choi

Young-Ho Lim

Jong-hyon Yi

Sang-wook Yoo

Seok-min Han

A tomography method for generating a computed tomography (CT) image, including generating a first tomography image based on first raw data corresponding to a received X-ray comprising acquired photons; determining second raw data by generating a second tomography image having an increased resolution in comparison with the first tomography image and performing forward projection on the second tomography image; determining third raw data based on a first parameter, the first raw data, and the second raw data; and generating a third tomography image based on the third raw data, wherein the determining of the third raw data may be based on information about a distribution of the acquired photons, the information being included in at least one from among the first raw data and the second raw data.

Tomography apparatus and method for reconstructing tomography image thereof

Semiconductor devices are specially made to be amenable to group testing, with special testing apparatus. The devices include at least one additional pad, and a special circuit that includes at least one fuse. After DC testing, the fuse may be cut if the device is flawed. The power supply is then redirected through the additional pad for subsequent AC testing. The circuit is such that, if the fuse were cut, the device is removed from the group, so as not to affect the other devices of the group. But if the fuse were not cut, the device is included for the AC testing.

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Yongin-si, South Korea

Ki-hwan Choi