University of Florida Research Foundation, Incorporated

Varian Semiconductor Equipment Associates, Inc.

National Technology & Engineering Solutions of Sandia, LLC

Kevin S Jones

Christopher R Hatem

George T Wang

Shadi Al Khateeb

William M Brewer

Nicholas G Rudawski

Benjamin Colombeau

Roozbeh Tabrizian

Keshab R Sapkota

Emily M Turner

Aaron Lind

In one aspect, the disclosure relates to a super high frequency (SHF) or extremely high frequency (EHF) bulk acoustic resonator that includes a nanostructure, wherein the nanostructure includes a substrate, a three-dimensional structure disposed on the substrate, wherein the three-dimensional structure includes a planar structure including at least one nanocomponent and a matrix material contacting the nanocomponent on at least one side, the matrix material including an SiGe alloy or Ge. The disclosed bulk acoustic resonator operates at frequencies of from about 100 MHz to about 100 GHz, is capable of self-amplification upon application of direct current or voltage, and has a Q factor amplification exceeding 1. Also disclosed are methods for amplification of mechanical resonance in the disclosed bulk acoustic resonators and devices incorporating the bulk acoustic resonators.

Self-amplified resonators with embedded piezoresistive elements for high performance, ultra-low SWaP microwave and millimeter-wave applications

A layered heterostructure, comprising alternating layers of different semiconductors, wherein one of the atom species of one of the semiconductors has a faster diffusion rate along an oxidizing interface than an atom species of the other semiconductor at an oxidizing temperature, can be used to fabricate embedded nanostructures with arbitrary shape. The result of the oxidation will be an embedded nanostructure comprising the semiconductor having slower diffusing atom species surrounded by the semiconductor having the higher diffusing atom species. The method enables the fabrication of low- and multi-dimensional quantum-scale embedded nanostructures, such as quantum dots (QDs), toroids, and ellipsoids.

Method for fabricating embedded nanostructures with arbitrary shape

Embodiments of the present disclosure provide for cathodes having a metal sulfide thin layer, devices including cathodes, lithium ion batteries including cathodes, methods of making cathodes, and the like.

Lithium ion battery cathodes, methods of making, and methods of use thereof

Various nanostructures, including silicon nanowires and encapsulated silicon nanoislands, and methods of making the nanostructures are provided. The methods can include providing a fin structure extending above a substrate, wherein the fin structure has at least one silicon layer and at least two silicon:germanium alloy (SiGe) layers that define sidewalls of the fin structure; and annealing the fin structure in oxygen to form a silicon nanowire assembly. The silicon nanowire assembly can include a silicon nanowire, a SiGe matrix surrounding the silicon nanowire; and a silicon oxide layer disposed on the SiGe matrix. The annealing can be, for example, at a temperature between 800&#xb0; C. and 1000&#xb0; C. for five minutes to sixty minutes. The silicon nanowire can have a long axis extending along the fin axis, with perpendicular first and second dimensions extending less than 50 nm along directions perpendicular to the fin axis.

Encapsulated nanostructures and devices containing encapsulated nanostructures

Encapsulated nanostructures and method for fabricating

A method of doping a compound semiconductor substrate includes: setting a first substrate temperature for the compound semiconductor substrate in a first temperature range; implanting a dopant species into the compound semiconductor substrate at a first ion dose at the first substrate temperature; and annealing the compound semiconductor substrate after the implanting the ions. In conjunction with the annealing, the first ion dose is effective to generate a first dopant activation in the first temperature range higher than a second dopant activation resulting from implantation of the first ion dose at a second substrate temperature below the first temperature range, and is higher than a third dopant activation resulting from implantation of the first ion dose at a third substrate temperature above the first temperature range.

Techniques for increased dopant activation in compound semiconductors

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Archer, FL, United States of America

Kevin S Jones