General Electric Company

Sabic Innovative Plastics IP B.v.

Dow Global Technolgoies LLC

General Electric Corporation Gmbh

Kevin Patrick Capaldo

John Frederick Graf

Grant Hay

Karkala Arun Kumar

Masako Yamada

Marshall Gordon Jones

Yan Mei Zhang

Mark Allen Cheverton

Dennis Joseph Coyle

Steven Alfred Tysoe

Adel Fawzy Bastawros

Ashwit Dias

Todd Morris Loehr

Gheorghe Cojocariu

Chunghei Yeung

Yu Hu

Kevin George Harding

Philippe Schottland

Theodorus L Hoeks

Robert William Tait

Emine Elif Gurel

Chung-hei Simon Yeung

Nathan D Hoffman

Scott Leslie

Anshu Ghosal

Bret Ja Chisholm

Safwat Ebeid Tadros

Michael John Davis

Todd R Bryden

Jian Zhou

Brian Thomas Carvill

Paul Michael Smigelski

Anne Elizabeth Herrmann

Elif Gurel

Charles Ray Vickers

Andrei Sharygin

Mahari Tjahjadi

Melissa A Mushrush

Scott A Sprague

Sameer Kirti Talsania

The invention is a method of forming a cadmium sulfide based buffer on a copper chalcogenide based absorber in making a photovoltaic cell. The buffer is sputtered in two steps the first being at low rates or relatively high pressures and the second at high rates or relatively low pressures. The resulting cell has good efficiency and according to one embodiment is characterized by a narrow interface between the absorber and buffer layers. The buffer is further characterized according to a second embodiment by a relatively high oxygen content.

Method of manufacture of chalcogenide-based photovoltaic cells

A light collimating and diffusing film and a method for making the film are provided. The film includes a plastic layer having a first side and a second side opposite the first side and at least a first peripheral edge. The first side has a first textured surface, wherein between 7 to 20 percent of slope angles on the first textured surface proximate a first axis has a value between zero and five degrees. The first axis is substantially parallel to the first peripheral edge. The plastic layer collimates light propagating therethrough.

Light collimating and diffusing film and system for making the film

A light diffusing film for a back light display is described. The light diffusing film includes a unitary film consisting essentially of polycarbonate and a uniformly dispersed anti-static material in an amount sufficient to impart anti-static properties to the film. The anti-static material may comprise a fluorinated phosphonium sulfonate. The film may additionally include at least one textured surface for the low scattering of light. Alternatively, the film may additionally include a uniformly dispersed acrylic bulk scattering additive of particles having a mean particle size of from about 3 to about 10 microns and present in an amount from about 2 to about 7 percent by weight percent for the high scattering of light.

Diffuser for flat panel display

Disclosed herein is a display film stack for a backlight display system. In one embodiment, the display system comprises: a light source, a first film comprising a first surface texture layer that is formed of a first material of a first refractive index, and a second film comprising a second surface texture layer that is formed of a second material of a second refractive index. The second film is disposed between the light source and the first film. The second refractive index is greater than the first refractive index. The light source is disposed in optical communication with the first film and the second film. The first surface texture layer and the second surface texture layer comprise unit structures independently selected from the group consisting of hemispherical structures, partial hemispherical structures, ellipsoidal structures, immersed spherical beads, ellipsoidal beads, 'bell-shape' bump and complex lens shape structures.

Display film stacks and a method of modeling the films

A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

System and method for detecting repeating defects in a light-management film

A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.

Integrated inspection system and defect correction method

A light management film includes a first layer with a thermoplastic resin and a particular phosphonium sulfonate salt, and a second layer formed from a curable composition and having a refractive index of at least 1.5. The light management film exhibits reduced static electricity build-up and reduced dust attraction, making it easier to handle during fabrication of display devices such as the flat panel displays of laptop computers.

Light management film and its preparation and use

A method of inspecting a light-management film comprises reflecting light from an overhead light source off a first side of the light-management film and examining the light-management film for defects; directing transmission light from a backlight source through a second side of the light-management film to the first side and examining the light-management film for defects; reflecting light from the overhead light source off the second side of the light-management film and examining the light-management film for defects; directing transmission light from the backlight source through the first side of the light-management film to the second side and examining the light-management film for defects; and measuring a location of each of the examined defects in the light-management film.

System and method for inspecting a light-management film and method of making the light-management film

In one embodiment, a brightness enhancement film comprises: a diffusing film comprising a front surface and a back surface, a coating on the front surface, and light redirecting structures disposed in the coating. The brightness enhancement film is capable of collimating light, and wherein, without the coating, the diffusing film would be capable of spread light passing through the back surface. In another embodiment, the brightness enhancement film comprises: a diffusing film comprising a front surface and a back surface, a coating on the front surface, and light redirecting structures disposed in the coating. The diffusing film has a stress retardation gradient of less than or equal to 50 nm/in, wherein an interval for calculation of the stress retardation gradient is less than 1 inch. The brightness enhancement film is capable of collimating light.

Brightness enhancement film, and methods of making and using the same

A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device operably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

System and method for detecting defects in a light-management film

An apparatus and method for quantitatively measuring ripple and distortion levels in a transparent sheet (or film) material is provided. The apparatus includes a light source for projecting light beams onto a screen. A frame assembly is positioned intermediate to the light source and is adapted to hold the transparent sheet material at a predetermined angle and distance from the screen. The light beams pass though the transparent sheet material and projects an image onto the screen. The process includes digitally capturing the image and generating parameter signals from the digital image. The parameter signals are used in a model to quantitatively assign a value to the level of ripple and distortion present in the transparent sheet material.

Method and apparatus for measuring ripple and distortion in a transparent material

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Mt. Vernon, IN, United States of America

Kevin Patrick Capaldo