Teradyne, Inc.

Kevin P Manning

Keith J Breinlinger

Frank Parrish

Roya Yaghmai

Derek Castellano

Mohamadreza Ray Mirkhani

Timothy Lee Farris

An example test system has resources that are distributed for access by a device under test (DUT). The example test system includes a device interface board (DIB) having sites to connect to devices to test, and a tester having slots configured to hold test instruments. Each test instrument has resources that are distributed over a dimension of the DIB. The resources are distributed to enable the devices in the sites equal access to the resources.

Test system having distributed resources

Automatic test equipment adapted for testing a plurality of devices-under-test (DUTs) is disclosed. The automatic test equipment includes a mainframe computer and a test head coupled to the mainframe computer. The test head includes a low-profile tester interface having a first interface board and a device board. The device board engages contact points on the DUTs and includes a topside. A hard stop is mounted to the first interface board and defines a reference plane. The hard stop is adapted to engage the device board topside to vertically fix the device board, positionally with respect to the first interface board. The automatic test equipment further includes a compliant interconnect array adapted for compression between the first interface board and the device board.

Low compliance tester interface

Growing community of inventors

Thousand Oaks, CA, United States of America

Kevin P Manning