International Business Machines Corporation

Kevin M Tompsett

Michael Richard Ouellette

Michael Thomas Fragano

Ciaran J Brennan

Steven Michael Eustis

Jeremy Paul Rowland

David J Wager

Neelesh Govindaraya Pai

A method of manufacturing a device having embedded memory including a plurality of memory cells. During manufacturing test, a first test stress is applied to selected cells of the plurality of memory cells with a built-in self test. At least one weak memory cell is identified. The at least one weak memory cell is repaired. A second test stress is applied to the selected cells and the repaired cells with the built-in self test.

Method and apparatus for test and repair of marginally functional SRAM cells

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Summit, NJ, United States of America

Kevin M Tompsett