Roku, Inc.

Kevin Henely

Beth Teresa Logan

Vijay Anand Raghavan

Sayan Maity

Sahib Bal

Suvrath V Penmetcha

Le Zhang

A method may include determining a combination of values of attributes represented by reference data associated with computing devices by training a machine learning model based on an association between (i) respective values of the attributes and (ii) the computing devices entering a device state. The combination may be correlated with entry into the device state. The method may also include selecting a subset of the computing devices that is associated with the combination of values. The method may additionally include determining a first rate at which computing devices of the subset have entered the device state during a first time period and a second rate at which one or more computing devices associated with the combination have entered the device state during a second time period, and generating an indication that the two rates differ.

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San Francisco, CA, United States of America

Kevin Henely