Intel Corporation

Kevin Gotze

Stephen Anthony Fischer

Kirk D Brannock

Jiangtao Li

Yuriy Bulygin

Gregory M Iovino

David Johnston

Sanu K Mathew

Wei Wu

Patrick Koeberl

George W Cox

Anand Rajan

Embodiments of an invention for using dark bits to reduce physically unclonable function (PUF) error rates are disclosed. In one embodiment, an integrated circuit includes a PUF cell array and dark bit logic. The PUF cell array is to provide a raw PUF value. The dark bit logic is to select PUF cells to mark as dark bits and to generate a dark bit mask based on repeated testing of the PUF cell array.

Dark bits to reduce physically unclonable function error rates

In one embodiment, a processor includes at least one execution unit and Return Oriented Programming (ROP) detection logic. The ROP detection logic may determine a ROP metric based on a plurality of control transfer events. The ROP detection logic may also determine whether the ROP metric exceeds a threshold. The ROP detection logic may also, in response to a determination that the ROP metric exceeds the threshold, provide a ROP attack notification.

Detection of return oriented programming attacks

A method, of an aspect, includes challenging a set of Physically Unclonable Function (PUF) cells, of an integrated circuit device, and receiving a set of PUF bits from the PUF cells in response. A PUF key is generated based on the set of PUF bits. An encryption of the PUF key with an embedded key is output from the integrated circuit device. The integrated circuit device receives an encryption of a fuse key with the PUF key. Fuses of the integrated circuit device are programmed with at least one of the fuse key and the received encryption of the fuse key with the PUF key. Other methods, apparatus, and systems are also disclosed.

Secure provisioning of secret keys during integrated circuit manufacturing

An integrated circuit substrate of an aspect includes a plurality of exposed electrical contacts. The integrated circuit substrate also includes an inaccessible set of Physically Unclonable Function (PUF) cells to generate an inaccessible set of PUF bits that are not accessible through the exposed electrical contacts. The integrated circuit substrate also includes an accessible set of PUF cells to generate an accessible set of PUF bits that are accessible through the exposed electrical contacts. Other apparatus, methods, and systems are also disclosed.

Integrated circuits having accessible and inaccessible physically unclonable functions

Embodiments of an invention for fuse attestation to secure the provisioning of secret keys during integrated circuit manufacturing are disclosed. In one embodiment, an apparatus includes a storage location, a physically unclonable function (PUF) circuit, a PUF key generator, an encryption unit, and a plurality of fuses. The storage location is to store a configuration fuse value. The PUF circuit is to provide a PUF value. The PUF key generator is to generate a PUF key based on the PUF value. The encryption unit is to encrypt the configuration fuse value using the PUF key. The PUF key and the configuration fuse value are to be provided to a key server. The key server is to determine that the configuration fuse value indicates that the apparatus is a production component, and, in response, provide a fuse key to be stored in the plurality of fuses.

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Hillsboro, OR, United States of America

Kevin Gotze