Lockheed Martin Corporation

Kevin F Williams

John G Hughes

Mark T Myers

David J Falabella

Walter B May

Calvin L Powell

James M Stana

Jeff Cole

Michael C Snead

Ronald H Gilmore

James Juliano

Valerie Potthoff

Systems and methods for reconstructing pixel values at bad (i.e. fully or partially defective, saturated, and/or non-responsive in one or more spectral bands) pixel locations in multi-spectral photo-detectors are provided herein. A detector having pixel locations responsive in two or more spectral bands may have pixel values at bad pixel locations reconstructed from adjacent pixel location band ratios so long as the bad pixel location is operational/responsive in at least one spectral band. Pixel locations may be two (or more) color pixels, stacked FPAs, 'virtual' locations created by mapping pixels in a first detector to pixels in a second detector, or 'super pixels' defined on a detector with a patterned band-pass filter.

Complementary pixel reconstruction

An apparatus and method for evaluating window transmission loss comprising taking a plurality of photographs through a filter of a window to be evaluated, determining a percentage of the window shown in each photograph that is undamaged, and computing an estimate of transmission loss for the window from the percentages determined.

Portable evaluation of window transmission

A method for optical dithering and a dither device comprising a mounting structure, a refractive optic, an optic mounting structure surrounding the optic, and one or more linear drive motors. Four linear coils are preferably employed together with a control system operating in open loop mode. The dither device and method provides double resolution to a detector receiving output therefrom. The invention can operate in a single axis or in two axes.

Method and apparatus for optical dithering

A distributed aperture sensor system and sensing method comprising a plurality of sensors each having an aperture and window that provides electromagnetic interference shielding by a material with a bulk resistivity of less than or approximately equal to 10 ohm-cm that is substantially uniform throughout the window.

Bulk material windows for distributed aperture sensors

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Orlando, FL, United States of America

Kevin F Williams