Sony Semiconductor Solutions Corporation

Cadence Design Systems, Inc.

Kevin Chan

Nickhil Jakatdar

Emmanuel Drege

Svetlana Litvintseva

Francis Raquel

Mark A Miller

Ping Wah Wong

Sa Xiao

An image sensor comprises a plurality of pixels. Pixels are capable of detecting a change in an amount of light intensity and pixels are capable of detecting an amount of light intensity. In a first mode the sensor outputs data from the first one or more of the pixels. In a second mode the sensor outputs data from the second one or more of the pixels. The first mode may be a lower power operation mode and the second mode may be a higher power operation mode. At least one of the first mode and the second mode is selected by a processor based on at least one of a result of processing data output in the first mode and a result of processing data output in the second mode.

Methods and systems of low power facial recognition

An image sensor, electronic device and method thereof that performs on-sensor multiresolution deep neural network (DNN) processing, such as for gesture recognition. The image data is transformed into first resolution type image data and second resolution type image data. Based on detecting the first resolution type image data includes a predetermined object, processing the second resolution type image data using the second resolution type image data as input into the second DNN.

Image sensor with integrated efficient multiresolution hierarchical deep neural network (DNN)

An imaging device with a plurality of image sensing pixels and a plurality of event detection pixels is provided. The image sensing and event detection pixels can be provided as part of different arrays of pixels, or can be included within a common array of pixels. The event detection pixels are operated continuously to provide signals indicating the occurrence of events. In response to detecting an event, image sensing pixels are selectively operated. The selective operation of the image sensing pixels can include activation of image sensing pixels within one or more regions of interest, while image sensing pixels not included in any region of interest remain off. The selective operation of the image sensing pixels can include the selection of a frame rate applied across an array of mage sensing pixels, or within determined regions of interest.

Dynamic region of interest and frame rate for event based sensor and imaging camera

An image sensor, electronic device and method thereof that performs on-sensor single object class detection using an on-sensor single object class detection deep neural network (DNN), such as a face detection DNN. The single object class detection DNN includes a pixel array layer configured to capture an image and transfer image data of the captured image, and a logic and single object class detection deep neural network (DNN) layer that receives the image data directly from the pixel array layer and outputs the image data with the single object class detection data to a communication bus of an electronic device.

Image sensor with integrated single object class detection deep neural network (DNN)

A method and apparatus for modeling and cross correlation of design predicted criticalities include a feedback loop where information from the manufacturing process is provided to cross correlation engine for optimization of semiconductor manufacturing. The information may include parametric information, functional information, and hot spots determination. The sharing of information allows for design intent to be reflected in manufacturing metrology space; thus, allowing for more intelligent metrology and reduces cycle time.

Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing

A method and apparatus for mask optimization is provided. Mask design and production is optimized by providing proper weighting parameters for critical features. The parameters may include information such as parametric information, functional information, and hot spots determination.

Method and system for mask optimization

A method and apparatus for process optimization is provided. Process optimization improves parametric and functional yield post mask manufacturing.

Method and system for process optimization

A method and apparatus for inspection optimization is provided. Inspection optimization improves the parametric and functional yield using optimized inspection lists for in-line semiconductor manufacturing metrology and inspection equipment.

Growing community of inventors

San Jose, CA, United States of America

Kevin Chan