Dpix, LLC

Kevin Cadena

Shawn Michael O'Rourke

Jerome David Crocco

Kevin Granaas

Michael Keith Forsyth

John Luther

A method for improving the performance of an image sensor array includes performing an electrical test on the image sensor array, generating a test image from the electrical test to detect an open circuit in a data line of the image sensor array, performing a laser-weld operation the data line to weld a portion of the data line to ground, re-testing the image sensor array to confirm a successful laser-weld operation, performing a laser-cut on a readout portion of the data line, and re-testing the image sensor array to confirm a successful laser-cut operation.

Method and functional architecture for inline repair of defective imaging arrays

A flexible probe card according to the present invention includes a compression layer; a transport layer coupled to the compression layer; and a contact layer coupled to the transport layer. The compression layer is formed of encapsulated closed cell polyurethane foam. The transport layer includes connectors for coupling the flexible probe card to a tester. The contact interface layer includes embedded conductive wires placed in a fixed grid pattern in a silicon rubber layer, without a specific connector pattern associated either with the transport layer or a device under test.

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Pueblo, CO, United States of America

Kevin Cadena