Intel Corporation

Kevin B Redmond

Doug Kreager

Perla Redmond

Arnaud Lucres Amadjikpe

Tae Young Yang

Ronald Michael Kirby

Mustapha Amadu Abdulai

Devices and methods for testing microelectronic assemblies including wireless communications are disclosed herein. For example, in some embodiments, a wireless testing system may include a radio frequency (RF) shielded chamber; a device under test (DUT) in the RF shielded chamber, wherein the DUT includes an array of first antenna elements; a testing apparatus in the RF shielded chamber including an array of second antenna elements at a first surface of a substrate to receive a test signal from the DUT, wherein a distance between individual second antenna elements and an adjacent second antenna element is at least half of a wavelength of the test signal, and wherein a distance between the first antenna elements and the second antenna elements is within a near-field region; and an array of electrical switches, wherein an individual electrical switch is coupled to a respective individual second antenna element.

Near-field test apparatus for far-field antenna properties

A coaxial radio frequency adapter and method are disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions. A method employs an adapter to characterize losses in a system for evaluating a device under test.

Coaxial radio frequency adapter and method

A coaxial radio frequency adapter is disclosed. An adapter has a tapered signal pin and a tapered ground sleeve to maintain a consistent impedance and minimize reflections while connecting two elements having different dimensions.

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Beaverton, OR, United States of America

Kevin B Redmond