Lg Electronics Inc.

Keum Cheol Kwak

Jin Hong Kim

Hun Chul Seo

Kun Ho Ahn

Jin Sung Kim

Seong Yun Jeong

Chang Ho Lee

Tae Hee Jeong

Jin Yong 109-602 Sunkyung Apt Kim

Disclosed herein is a super resolution optical disc. The super resolution optical disc comprises dielectric layers, and a mask layer formed between the dielectric layers, in which the mask layer is constructed as a complex mask layer comprising a metallic oxide (MO) or metallic nitride (MN), and a metallic thin film formed thereon. A size of the cavities and an amount of metallic particles in cavities created by illumination of recording laser can be controlled to increase a level of a reproduction signal for recording marks and to enhance the quality of the reproduction signal.

Super resolution optical disc

Disclosed is a multi-layer super resolution optical disc. In the multi-layer super resolution optical disc, at least two recording layers, each of which comprises at least two mask layers and impact absorption layers formed between the mask layers, are laminated, and intermediate layers of polymer thermo-set by ultraviolet rays are formed between the recording layers. Accordingly, jitter characteristics for recording marks are improved, and recording density is enhanced.

Multi-layer super resolution optical disc

The disclosure includes a system, device, apparatus and programmed medium of measuring thickness of an optical disc by using an interference effect of the optical disc layer. Such a system can include: a spectroscope to separate light, reflected from a surface of an optical disc, into constituent frequencies thereof; an optical intensity measuring unit to measure intensities of the constituent frequencies, respectively, as a first spectrum of data; and a processor to do at least the following, convert the first spectrum data into a second spectrum of values that exhibits variation as a function wavelength and refractive index, transform the second spectrum using a Fast Fourier Transform, and detect a thickness of one or more of the spacer layer and the cover layer, respectively, based upon the transformed spectrum. The disclosed technologies have advantages for high precisely measuring thickness of an optical disc.

Technologies for measuring thickness of an optical disc

Disclosed is a super resolution optical disc. The super resolution optical disc comprises at least two mask layers. In one embodiment, the super resolution optical mask comprises a plurality of mask layers and impact absorption layers between the mask layers, and may further comprise diffusing prevention layers between the mask layer and the impact absorption layer. In another embodiment, the super resolution optical mask comprises a plurality of recording layers and dielectric layers separating the recording layers, each of the recording layers including two mask layers and an impact absorption layer between the mask layers or including two mask layers, an impact absorption layer between the mask layers, and diffusion preventing layers between the mask layer and the impact absorption layer. Accordingly, recording marks have an enhanced shape at an outer periphery of the marks, thereby enhancing the quality of the reproduction signal and enabling high-density multi-level recording.

An apparatus and method for testing mechanical endurance of a surface of an optical disc are disclosed. The apparatus includes a rotating plate, on which an optical disc to be scratched is loaded, for rotating the loaded optical disc, and a plurality of abrasion wheels of a predetermined type, disposed at a perpendicular to the rotating plate, for contacting the optical disc and generating the scratch, the scratch being generated when the optical disc rotates a predetermined number of turns, e.g., maximum of 5 turns for the abrasion wheels to apply a predetermined load on the optical disc.

Apparatus and method for testing mechanical endurance of a surface of an optical disc

A method of measuring thickness of an optical disc by using an interference effect of the optical disc layer is disclosed. The method includes detecting an intensity of a reflective light according to a wavelength of a light as spectrum data for each wavelength, converting the detected spectrum data for each wavelength into a spectrum value as a function of a wavelength that a refractive index is reflected, and detecting a position where the intensity of the reflective light has a peak as a thickness of a spacer layer and a cover layer respectively by converting the converted value into a length of an interference area for representing a layer thickness of the optical disc by the Fast Fourier Transform. The disclosed method has advantages for high precisely measuring thickness of an optical disc.

Method for measuring thickness of an optical disc

An apparatus and method for testing mechanical endurance of a surface of an optical disc are disclosed. The apparatus includes a rotating plate, on which an optical disc to be scratched is loaded, for rotating the loaded optical disc, and a plurality of abrasion wheels of a predetermined type, disposed at a perpendicular to the rotating plate, for contacting the optical disc and generating the scratch, the scratch being generated when the optical disc rotates a predetermined number of turns, e.g., a maximum of 5 turns for the abrasion wheels to apply a predetermined load on the optical disc.

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Seoul, South Korea

Keum Cheol Kwak