Samsung Electronics Co., Ltd.

Keonyoung Seo

Hwanjin Kim

Yangwoon Roh

Yeonsik Yu

Cheaok Ko

Jihun Yu

Kihuk Lee

Hwajoong Jung

Manho Kim

Jongwan Shim

Kwangmo Yang

Kwangsic Choi

Jungmin Kim

Byeonghwan Kang

Jaemin Ryoo

Bonghee Park

A method for identifying information on an external electronic device based on near field communication (NFC). The method includes transmitting a signal of an NFC band to the external electronic device; identifying whether the external electronic device is capable of NFC, requesting an NFC identifier (ID) from the external electronic device, and receiving the NFC ID from the external electronic device; receiving the NFC ID, reading a unique identifier from the NFC ID, and identifying a communication protocol type; identifying flag information included in the NFC ID; and determining whether the external electronic device is initially recognized and/or normally recognized through the flag information.

Electronic device and method for identifying product based on near field communication

A flexible printed circuit board that includes a signal transmission part that is disposed in a first direction and that includes a signal line that transmits an electrical signal and a ground part disposed in a second direction. The ground part includes a conductive adhesive layer disposed in the first direction and the conductive adhesive layer includes a plurality of conductive balls having electrical conductivity. Various other embodiments are disclosed in the specification.

Flexible printed circuit board and electronic device including the same

A method and an apparatus for measuring performance of an electronic device are provided. The apparatus includes an electromagnetic wave measuring device for measuring an actual level of an electromagnetic wave of an electronic device, and an analysis controller for applying a previously stored level change value to the actual level of the electromagnetic wave to compute a measured level of the electromagnetic wave. The method and the apparatus for measuring performance of an electronic device can easily measure an electromagnetic wave level of the electronic device without using a device suggested by an international standard.

Method and apparatus for measuring performance of electronic device

Growing community of inventors

Suwon-si, South Korea

Keonyoung Seo