Samsung Electronics Co., Ltd.

Keon-Hun Lee

Suk-ho Yoon

Do-Young Rhee

Kee-Won Lee

Jeong-wook Lee

Chul-min Kim

Sang-don Lee

Jong-uk Seo

Byoung-kyun Kim

Tae-Bang Nam

Eun-Deok Sim

Disclosed herein are a material layer stack, a light emitting element, a light emitting package, and a method of fabricating a light emitting element. The material layer stack includes: a substrate having a first lattice constant; and a semiconductor layer grown on the substrate, the semiconductor layer having a second lattice constant that is different from the first lattice constant. Using the material layer stack, a light emitting element having a low leakage current, a low operation voltage, and an excellent luminous efficiency can be obtained.

Material layer stack, light emitting element, light emitting package, and method of fabricating light emitting element

An apparatus for evaluating the quality of a crystal includes an optical device that measures a surface reflectance of a wafer in which a V-pit is formed; and a data processing unit that calculates a threading dislocation density by calculating a difference in surface reflectance of the wafer that is measured by the optical device.

Apparatus for evaluating quality of crystal, and method and apparatus for manufacturing semiconductor light-emitting device including the apparatus

Growing community of inventors

Seoul, South Korea

Keon-Hun Lee