Jasco Corporation

Kento Aizawa

Yoshiko Kubo

Tsutomu Inoue

Masateru Usuki

Norihito Fujiwara

Katsunori Morii

Hiroshi Sugiyama

Jun Koshobu

Takeo Soejima

Yuji Higuchi

Erika Taira

Daisuke Dogomi

An Attenuated total reflection measuring apparatus capable of Raman spectral measurement has an infrared optical instrument and a Raman module. The infrared optical instrument is disposed on an ATR prism side of a sample, and is provided to irradiate the ATR prism with an infrared light, and collect the infrared light from the ATR prism. The Raman module is disposed on a side opposite to the ATR prism side relative to the sample, and has a guide tube that outputs an excitation light from an excitation light source to the sample, and a lens portion disposed inside thereof. An end of the guide tube is in a position to push the sample to the ATR prism. The Raman module has a lens position adjustment mechanism that moves the lens portion along an optical axis, and a spectroscope that detects a Raman scattering light collected by the lens portion.

Attenuated total reflection measuring apparatus capable of Raman spectral measurement

The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope. A microspectroscopecomprises: a light sourcethat emits an excitation light to a sample; a condensing lensthat emits the excitation light to a predetermined position of the sampleand condenses a reflected light or a transmitted light from the sample; a spectrometerthat detects a condensed light; and an analysis control unitfor analyzing a signal from the spectrometer; the microspectroscopethat uses an observation image of the sampleto perform spectrometry, wherein

Microspectroscope having position correction function

A filter unit for a Raman microscope mounted with a dark-field objective lens unit includes a frame body, a plurality of UV-LED elements that is disposed around a window part of the frame body to emit UV light, and a long-pass filter that is supported to the frame body to cover the window part of the frame body and transmits a light having a wavelength longer than the wavelength of the UV light. The filter unit has a dark-field UV irradiation function, and is able to impart a fluorescence observation function to the Raman microscope.

Raman microscope having fluorescence observation function and filter unit

A method of analyzing foreign matter in a sample includes:

Foreign matter analysis Method, storage medium storing foreign matter analysis program, and foreign matter analysis apparatus

Microspectroscope having automatic sample detection function

To provide a microspectroscope that can perform a wide range mapping measurement with high sensitivity, at high speed, and with high wavelength resolution. The Raman spectroscope comprises: a unit for linearly irradiating excitation light; a movable stage for a sample; an objective lens for focusing Raman light from the linear irradiation region; an incident slit provided at the imaging position of Raman light; a spectrometer for diffusing the passing light; a CCD detector for detecting Raman spectral image; and a control device for controlling the mapping measurement by synchronizing the movable stage and the CCD detector. The control device controls the movable stage to move in the direction orthogonal to the longitudinal direction of the linear irradiation light and obtain one average spectrum. At the same time, the control device is configured to perform the cycle of the CCD detector while the stage is moving to obtain one average spectrum of the moving region of the linear irradiation region in one light detection cycle.

Microspectroscope

The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk. The infrared microscopecomprises a light source, an irradiating unitfor irradiating the infrared light from the light source to a sample, a focusing unitfor focusing the infrared light transmitted through or reflected by the sample, and a detectorfor detecting the focused infrared light. The irradiating unitcomprises a first aperture, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unitcomprises a second aperture, and the second aperture is disposed at an imaging position of the infrared light at the first aperture. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detectorto detect the infrared light as a detecting light. The second aperturehas holes that have the same size and arrangement as the first aperture

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Tokyo, Japan

Kento Aizawa