Intel Corporation

Lattice Semiconductor Corporation

Kent R Callahan

Keng L Wong

Robert M Bartel

Greg F Taylor

Tawfik Arabi

Ali Muhtaroglu

Gregory F Taylor

Xia Dai

Chee How Lim

Hung-Piao Ma

Usman Mughal

Douglas R Parker

Michael G France

Ravishankar Kuppuswamy

Masud Kamal

A method of providing a clock signal for an embodiment includes performing a calibration for a closed loop control system to determine a control signal value that provides a desired tuning of the closed loop control system. The control signal value is stored and provided to a delay circuit, wherein a delay range and a delay step size of the delay circuit is based on the control signal value. A delay select control signal is provided to the delay circuit to select a specific delay within the delay range.

Clock delay and skew control systems and methods

Systems and methods are disclosed herein to provide improved clock, delay, and skew techniques. For example, in accordance with an embodiment of the present invention, an integrated circuit includes a clock generator to provide a bias signal and a clock signal, with control logic providing a delay control signal based on the bias signal and a multi-bit control signal. A clock skew circuit provides a delay to the clock signal based on the delay control signal provided by the control signal. Memory coupled to the control logic provides the multi-bit control signal.

Clock systems and methods

Systems and methods are disclosed herein to provide improved clock, delay, and skew techniques. For example, in accordance with an embodiment of the present invention, an integrated circuit includes a clock generator to provide a bias signal and a clock signal, with control logic providing a delay control signal based on the bias signal and the control signal. A delay circuit provides a delay to the clock signal based on the delay control signal.

An on-die device is provided to measure/detect voltage fluctuations. This may include a control unit to generate differential reference signals (such as differential current signals), a first detector unit and a second detector unit. The differential reference signals may be generated based on a Vcc reference signal and a Vss reference signal. The first detector unit may receive the differential reference signals from the control unit and may receive first voltage signals (also called monitored signals) from a first device under test (DUT) located on the die or from a first area on the die. The first detector unit may provide (or output) a first signal indicative of a voltage fluctuation (voltage droop or overshoot) of the first voltage signals. The second detector unit may receive the differential reference signals from the control unit and may receive second voltage signals (also called monitored signals) from a second device under test (DUT) located on the die. The second detector unit may provide (or output) a second signal indicative of a voltage fluctuation (or voltage droop) of the second voltage signals.

Method and apparatus for on-die voltage fluctuation detection

A lock detector system which operates adaptively based on a frequency of operation. Different lock windows are defined for different frequencies of operation and are automatically formed based on the controlled signal that is used to drive the voltage controlled oscillator of the phase locked loop.

Variable lock window for a phase locked loop

Controlling time delay includes using a delay line and a digital to analog converter configured to provide a signal to the delay line and including digital inputs configured to control the delay through the delay line by controlling amplifier gain elements included in the digital to analog converter.

Controlling time delay

An apparatus and method for detecting and measuring internal clock jitter is disclosed. In one embodiment, a reference clock generator generates a reference clock signal based on an instantaneous clock signal. The reference clock signal includes the instantaneous clock signal delayed for an average duration. A phase comparing element receives both the instantaneous clock signal and the reference clock signal such that the phase comparing element measures a phase difference between the instantaneous clock signal and the reference clock signal. The magnitude and direction of the phase difference is indicated by one of a number of distinct phase difference bins in the phase comparing element.

Growing community of inventors

Hillsboro, OR, United States of America

Kent R Callahan