Hewlett-packard Company

Agilent Technologies, Inc.

Kent D Henry

James L Bertsch

Steven Michael Fischer

Paul C Goodley

Mark H Werlich

James Alexander Apffel, Jr

Curt Alan Flory

Eugene M Wong

A method and apparatus are disclosed wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The invention provides reduced noise and increased signal sensitivity in both API electrospray and APCI operating modes.

Orthogonal ion sampling for APCI mass spectrometry

A mass spectrometer is disclosed which yields fast, full-scan spectra over a wide mass-to-charge ratio range. The instrument contains an ion source which generates nearly monoenergetically-pulsed ion packets which spatially focus at a predetermined distance along the drift path of the ions, a mass filter/analyzer which linearly disperses or deflects the ions in the ion-packets by mass-to-charge ratio by applying a traverse, quadratically time-varying and increasing electric field over the entire length of the deflection region of the mass filter/analyzer, and a spatial mass detector. A method of analyzing the mass-to-charge ratio of ions is also disclosed.

Spatially-resolved electrical deflection mass spectrometry

The invention relates to an ionization chamber. More particularly, the invention relates to a mass spectrometer system having an electrospray ionization chamber incorporating an asymmetric electrode.

Ionization chamber and mass spectrometry system containing an asymmetric

The invention relates to an ionization chamber. More particularly, the invention relates to a mass spectrometry system having an ionization chamber containing an easily removable and replaceable capillary.

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Newark, CA, United States of America

Kent D Henry