Seiko Epson Corporation

Ns Technologies, Inc.

Kensuke Ogasawara

Yasushi Mizoguchi

Shuichi Wakabayashi

Takayuki Kitazawa

Daisuke Ishida

Yuma Iwahara

Takahito Sanekata

Hirokazu Ishida

Tatsunori Takahashi

A position detection method of detecting a position in an operation surface pointed by a pointing element, the method including irradiating with infrared light toward the operation surface, obtaining a first and second taken image calibrated with respect to the operation surface by imaging the operation surface with a first and second camera configured to take an image with the infrared light, forming a difference image between the first taken image and the second taken image, extracting an area in which an amount of disparity between the first taken image and the second taken image is within a predetermined range out of the difference image as a candidate area in which an image of the pointing element is included, detecting an area corresponding to a tip position of the pointing element from the candidate area extracted based on a shape of the pointing element, and outputting, based on the area corresponding to a tip position, information representing a pointing position of the pointing element in the operation surface and whether or not the pointing element had contact with the operation surface.

Position detection method, position detection device, and position detection system

An electronic component handler includes a first holder that is movable in a first direction and a second direction different from the first direction and is capable of holding an electronic component, a second holder that is movable in the first direction and the second direction independently of the first holder and is capable of holding the electronic component, a light irradiation section that is arranged so as to be capable of irradiating an electronic component placement portion on which the electronic component is placed with light through a gap between the first holder and the second holder, and an imaging section that is capable of imaging the electronic component placement portion irradiated with the light in the first direction, and determines whether or not the electronic component is placed on the electronic component placement portion based on the imaging result obtained by imaging by the imaging section.

Electronic component handler and electronic component tester

Growing community of inventors

Matsumoto, Japan

Kensuke Ogasawara