Adv Antest Corporation

Takeda Riken Kogyo Kabushiki Kaisha

Kenpei Suzuki

Noriyuki Igarashi

Hiroyuki Takahashi

Hiroshi Sato

Shinichi Koya

A test handler decreases an index time in testing IC devices and improves a positioning accuracy for placing the IC devices on a test position of an IC tester. The test handler includes a turn table having a plurality of openings each of which is equally distanced from the other, and at least one of the openings is positioned right above a test socket provided on the IC tester, a plurality of carrier modules attached to the corresponding openings of the turn table where each of the carrier modules has a center opening to receive an IC device to be tested, and a press mechanism provided above the test socket of the IC tester to press the IC device in the carrier module downward so that pins of the IC device contact the test socket. The center opening of the carrier module has tapered walls at the periphery thereof where an upper portion of the center opening is wider than a lower portion of the center opening, and a plurality of guide slits are provided on the tapered walls of the center opening for guiding the pins of the IC device therethrough when the IC device is pressed by the press mechanism.

Test handler having turn table

A device transfer mechanism of an IC test handler is disclosed which is low cost, requires less space and has an inexpensive and simple structure. The device transfer mechanism can readily change a soak time for applying predetermined temperature to the devices to be tested according to the device test time. A device transfer mechanism includes a circular-orbit rotation table with multiple pockets that stores the devices by a unit of n pieces on the disk-shaped rotation table, and at least three arms each of which has a contact arm with a suction section that sucks the devices by a unit of n pieces at the tip of each arm. A rotation storage arm can be additionally provided to transfer the devices by arranging multiple arms with pockets that store devices 71 by a unit of n pieces at the tip of each arm. In a further aspect of the transfer mechanism, pockets that store the devices by a unit of n pieces at the tip of each arm can be disposed along with a reciprocal storage arm that transfers the devices in a reciprocal movement to a storage buffer section.

Device transfer mechanism for IC test handler

In a contact drive assembly for use with test equipment for testing, for example, an IC element, a movable contact piece is brought into contact with a terminal pin of the IC element to connect it to a measuring circuit. A flexible tube is disposed adjacent the movable contact piece and compressed air is supplied to the flexible tube to inflate it, biasing the movable contact piece to engage with or disengage from the terminal pin.

Growing community of inventors

Gyoda, Japan

Kenpei Suzuki