Oracle America, Inc.

Kenny C Cross

Daniel J Beckman

A system that detects degradation in an integrated circuit chip. During operation, the system monitors a pair of pins on the integrated circuit chip and in doing so, generates a time series of parameters for the pins. The system then determines whether the time series of parameters indicates that the integrated circuit chip has degraded. If so, the system generates a signal indicating that the integrated circuit chip has degraded.

Growing community of inventors

San Diego, CA, United States of America

Kenny C Cross