Electro Scientific Industries, Inc.

Advanced Inquiry Systems, Inc.

Kenneth S Whiteman

John D Stackpole

A wafer/wafer translator pair in the attached state, with the wafer translator extending beyond the outer circumference of the wafer, is disposed on a rotation stage. At least one surface of the edge-extended wafer translator, in a peripheral annular region, provides contact pads electrically coupled to corresponding pads on the wafer, and a caliper-style contact block, operable to move perpendicularly the edge-extended wafer translator is positioned such the contact pads of the annular region may be electrically engaged with the contact block. After electrical communication between the wafer and the contact block, the contact block moves to a disengagement position, the rotation stage rotates the wafer/wafer translator pair to a new position and the contact block may then move into engagement with different contact pads in the annular region.

Methods and apparatus for rotationally accessed tester interface

Replaceable component carriers () are adapted to be freely floating in belt apertures () and have alignment features (), such as conical holes (), mated to features (), such as tapered pins (), in processing stations to temporarily hold a carrier () and its components (), such as resistors, in a fixed position during various processes, such as termination. The carriers () include a rigid substructure () and a more elastic coating () to provide receiving holes () that can be adapted to hold particular components (). The carriers () can be replaced without removing the belt (), whenever differently shaped holes () are desired or become too worn to reliably handle components (), thereby reducing damage risk, replacement cost, and operational down time of the belt ().

Growing community of inventors

Portland, OR, United States of America

Kenneth S Whiteman