Tektronix, Inc.

Textronix, Inc.

Tektronik, Inc.

Kenneth P Dobyns

Robert R Kreitzer

J Steven Lyford

Gary J Waldo

Preston S Gabel

Paul M Gerlach

Kristie L Veith

Steven K Sullivan

Daniel G Knierim

Ira G Pollock

Josiah A Bartlett

Lester L Larson

Michael Duane Stevens

Steven C Herring

Scott R Jansen

Kathryn A Engholm

Keith D Rule

Kevin C Ayers

William R Pooley

Roy I Siegel

Marcus Kieling Da Silva

Scott Ketterer

Terrance R Beale

Amy M Bergsieker

David P Maguire

Jonah S Griffith

Jared Randall

Michael J Mende

Joshua M Kornfeld

Alfred K Hillman, Jr

Samuel J Peters, Ii

Michael Dale Stevens

Lance H Forsberg

Michael J Wadzita

Jordan Patrick Evans

Benjamin A Ward

Peter J Letts

Lynne A Fitzsimmons

Jeffrey A Kleck

Scott R Ketterer

Brian G Russell

Kevin E Cosgrove

Robert C Proebstel

Richard A Van Epps

Evan A Dickinson

Marcus K DaSilva

George S Walker

Robert L Beasley

Pechluck S Laskey

Mark A Briscoe

Steven R Bingold

Phelan W Miller

Donovan E Hammer

Stony D Yakovac

Jing-Fan Zhang

Robert A Nishida

James R Tsadilas

Alfred K Hillman

A test and measurement instrument including a plurality of digitizers, each digitizer configured to digitize an input signal to generate a digitized signal; a signal processor configured to combine at least two of the digitized signals from the digitizers into a combined signal; and a circuit configured to receive the combined signal.

Test and measurement instrument using combined signals

Front panel for a measurement instrument

Embodiments of the invention include methods and instruments for performing combinatorial mask triggering. One or more mask triggers can be configured. Combinatorial mask triggering logic can make various determinations about the relationship between a digitized signal and the one or more mask triggers. The various determinations about the relationship can include considerations of both space and time. When the combinatorial trigger criteria have been satisfied, a trigger signal is generated, and the digital data associated with an incoming signal is stored to memory. The combinatorial mask triggering logic can operate on signals in the frequency domain, the time domain, or both.

Combinatorial mask triggering in time or frequency domain

A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to process an input signal to generate a time domain waveform for display in the time domain graticule, the input signal being correlated to a time base. The processor is also configured to process a second input signal and generate a frequency domain waveform for display in the frequency domain graticule, the second input signal being correlated to the same time base. The frequency domain waveform is correlated to a selected time period of the time base. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a transform parameter, a location and the selected time period in the time domain graticule with respect to the frequency domain waveform.

Apparatus and method for providing frequency domain display with visual indication of FFT window shape

Disclosed is a test and measurement instrument that includes a signal input structured to receive a modulated radio frequency (RF) signal under test and a demodulator structured to extract a digital signal from the received modulated RF signal. The extracted digital signal has a measurable parameter. The instrument also includes a display controller structured to display the extracted demodulated signal at one of at least two different intensities based on the measured parameter of the digital signal. In other embodiments the signal need not be an RF signal. Methods of operation are also described.

Selective display of waveforms governed by measured parameters

Plug for accessory-host interface

Embodiments of the invention include devices and methods for searching IQ-based time-domain traces for events, marking the events, and analyzing intervals of interest at or around the events on a display unit of a test and measurement instrument. The test and measurement instrument can include an input terminal to receive an RF signal, an ADC to digitize the RF signal, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized RF signal, an acquisition memory to acquire and store a record, a trace generation section to generate one or more IQ-based time-domain traces, and a search unit to scan the IQ-based time-domain traces for one or more events. The search unit can locate and mark the events for display on a display unit of the test and measurement instrument.

Time-domain searching in a test and measurement instrument

An apparatus and method for triggering an oscilloscope is disclosed. The oscilloscope is configured to process a first signal in a first domain and a second signal in a second domain. The method includes choosing a different domain for processing each of the first and second signals, respectively. A desired trigger type is selected for one of the chosen domains. The first and second signals are acquired in response to an occurrence of a trigger of the selected trigger type. The first and second signals are processed according to the selected different chosen domains. The method may also include displaying a result of said processing on a display screen.

Cross domain triggering in a test and measurement instrument

Receptacle for accessory-host interface

A test and measurement instrument including a plurality of input ports; an acquisition system coupled to the input ports and configured to acquire frequency domain data from the input ports; a user interface configured to present frequency domain controls for at least two of the input ports; and a controller configured to adjust frequency domain acquisition parameters of the acquisition system in response to the frequency domain controls such that frequency domain acquisition parameters associated with a first input port can be different from frequency domain acquisition parameters associated with a second input port.

Multi-channel frequency domain test and measurement instrument

A test and measurement instrument including a time domain channel configured to process a first input signal for analysis in a time domain; a frequency domain channel configured to process a second input signal for analysis in a frequency domain; and an acquisition system coupled to the time domain channel and the frequency domain channel. The acquisition system is configured to acquire data from the time domain channel and the frequency domain channel. Time domain and frequency domain data can be time aligned.

Multi-domain test and measurement instrument

A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Signal acquisition system having reduced probe loading of a device under test

Embodiments of this invention provide enhanced triggering capabilities such as frequency and phase triggering in a test and measurement instrument, such as a Real-Time Spectrum Analyzer (RTSA) or oscilloscope. A test and measurement instrument can include input terminals to receive RF signals, an ADC to digitize the RF signals, a digital downconverter to produce I and Q baseband component information, and a power detector to determine a power level using the I and Q information. A comparator compares the power level received from the power detector with a user-definable power threshold, and produces a logic signal for enabling one or more phase or frequency demodulators. The one or more demodulators produce IQ-based time-domain traces derived from the I and Q component information when the power level determined by the power detector exceeds the power threshold. Trigger circuitry is configured to trigger on an event responsive to a delayed trigger enable signal.

Time-domain triggering in a test and measurement instrument

Growing community of inventors

Beaverton, OR, United States of America

Kenneth P Dobyns