Eubanks Engineering Co.

Cablescan, Inc.

Thomas & Betts Corporation

Kenneth N Rockwell

Roy G Brant

Harold Minuskin

In circuit tester apparatus using one or more carrier elements, each carrier element having one or more first electrical connectors, the combination comprising one or more base sections, one or more second electrical connectors carried by the section or sections and positioned to interfit the one or more first electrical connectors when the element or elements are assembled to the section or sections, at least two of the multiple base sections located for bridging thereof by at least one carrier element. Carrier elements may comprise adapter cards.

Interface for cable testing

A wire harness testing apparatus which comprises a universal interface module having interconnect terminals, the module electrically connected to a test system; a group of wire harness mating connectors; and a series of modular interface adapters comprising a group of cables, standardized connectors respectively at one end of each cable, and connectible to the universal interface interconnect terminals, and special connectors at the other ends of the cable, respectively, and connectible to the wire harness mating connectors; the cables extending in electrically parallel relation.

Wire harness modular interface adapter system and testing apparatus

A test system for evaluation of a terminated cable harness examines both the correctness of cable conductor connections and the correctness of the load circuitry to which the conductors are connected. Electrical continuity testing is employed for conductor layout evaluation and transition circuitry is introduced between the continuity tester and the cable to accommodate parametric evaluation of the load circuitry.

Apparatus for testing multiconductor cables and having transition

High speed solid state apparatus is described for learning, testing and monitoring the assembly of multiconductor harnesses. Testing a harness having a very large number of end points within the matter of a few seconds is made possible through the employment of plural high speed scanning means which operate independently of one another and simultaneously scan groups of points to identify both continuity and open circuit conditions. During a learning mode, all short circuit and open circuit conditions of a known good harness are transferred into high speed memory means. Said plurality of scanning means examine all points relative to a preselected point during a scan cycle, repeating scan cycles for every point to be tested. Data representative of the detected interconnections are transferred to memory when all of said plural scanning means have completed the scan for said preselected point. The system provides for: learning the connections of a known good harness and storing data representative of the connections in high speed memory; high speed testing of completed harnesses by examination of the harness at high speed to ascertain the interconnections and comparing interconnections against the data stored in memory; and monitoring the assembly of a cable to provide direct indications of an incorrect connection, as well as having a capability of permanently latching a momentary fault condition for purposes of localizing the spurious condition.

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Yorba Linda, CA, United States of America

Kenneth N Rockwell