Zyvex Corporation

Zyvex Instruments, LLC

Kenneth Bray

George Dee Skidmore

Matthew D Ellis

Robert J Folaron

Aaron Geisberger

Christof Baur

Kimberly Tuck

A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.

Method, system and device for microscopic examination employing fib-prepared sample grasping element

An apparatus including a base configured to slidably engage a driven element, a piezoelectric element interposing the base and the driven element and attached to the base proximate a first piezoelectric element end, and a friction element attached proximate a second piezoelectric element end and configured to selectively engage the driven element.

Positioning device for microscopic motion

Growing community of inventors

Garland, TX, United States of America

Kenneth Bray