Applied Research Associates, Inc.

Kenneth A McIntosh

Stephen P Farrington

James D Shinn, Ii

Charles R Reed, Jr

Subsurface material property measurements, such as soil or chemical properties, are obtained in situ by a direct push method that includes rotating a ring bit at the end of a casing to drill through subsurface materials, lowering a measurement probe through the advanced casing, extending the lowered measurement probe through the ring bit, and advancing the extended probe through the soil at a controlled rate while gathering material property data from sensors attached to the probe. The probe may be withdrawn for drilling, and then replaced for further data gathering.

Growing community of inventors

Bethel, VT, United States of America

Kenneth A McIntosh