Kabushiki Kaisha Toshiba

Sony Mobile Communications Inc.

Kenji Ohmori

Takashi Yamamoto

Masafumi Takahashi

Masahiro Furutani

An image photographing apparatus is provided, which includes a camera section having a zoom function for changing a photographing field angle, a transmissive display section including a display surface that allows sides facing each other to be transmissively viewed from both directions of a housing front side and a housing back side, a distance detection section that detects a distance from a point of view of a photographer to the display surface of the display section, and a control section. The control section controls the display surface of the transmissive display section in a transmissively viewable state when in photographing mode so as to perform photographing by the camera section, and determines a photographing field angle using the zoom function of the camera section in response to the distance detected by the distance detection section.

Image photographing apparatus, method of controlling image photographing apparatus and control program

A logic circuit having a self-test function includes a plurality of F/Fs having at least first-, second- and last-stage scanning F/Fs, each having a clock input, a scanning input and a scanning output terminals. The scanning F/Fs are connected one another so as to supply a scanning clock signal to the clock input terminal of each scanning F/F and a signal from the scanning output terminal of the first-stage to the scanning input terminal of the second-stage for sequential logical operations. Also provided in the logic circuit are a data selector to select either an external scanning signal or a signal output from the scanning output terminal of the last-stage and fed back through a feed-back signal line and a scanning controller to supply a control signal to the data selector so as to supply the signal fed back from the last-stage to the scanning input terminal of the first-stage, thus controlling each F/F in an internal scanning mode. The signal from the last-stage is supplied from the logic circuit via an external scanning output terminal.

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Kanagawa, Japan

Kenji Ohmori