Shimadzu Corporation

Osaka University

Kenji Kimura

Takahiro Doki

Taro Shirai

Satoshi Sano

Akira Horiba

Naoki Morimoto

Koichi Tanabe

Toshinori Yoshimuta

Hiroyuki Kishihara

Shingo Furui

Yukihisa Wada

Heiji Watanabe

Takayoshi Shimura

Takuji Hosoi

Takuro Izumi

Akihiro Nishimura

Toshiyuki Sato

Masanobu Sato

Satoshi Tokuda

Shoichi Okamura

Hiroshi Mizushima

An X-ray phase imaging apparatus includes an X-ray source; an X-ray detector; a plurality of gratings; a subject holder arranged in an X-ray irradiation area and configured to hold the subject; and an image processor configured to generate an X-ray phase contrast image based on an intensity distribution of the X-rays detected by the X-ray detector. The subject holder is formed of a first material having an X-ray transmittance greater than metal and a scattering degree smaller than the metal.

X-ray phase imaging apparatus

The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.

X-ray phase imaging apparatus and X-ray phase contrast image generation method

An X-ray imaging apparatus is configured to acquire a plurality of pieces of slice image data from volume data, acquire a plurality of pieces of first processed image data by performing first processing, acquire a plurality of pieces of second processed image data by performing second processing, detect edges of the subject based on the acquired plurality of pieces of the second processed image data, and acquire edge image data including detected edges of the subject.

X-ray imaging apparatus and x-ray imaging method

The X-ray imaging device () is provided with an X-ray source (), a plurality of gratings, a moving mechanism (), and an image processing unit (). The image processing unit () is configured to generate a phase-contrast image () by associating a pixel value in each pixel of a subject (T) in a plurality of subject images () with phase values of a Moire fringe () at each pixel and aligning the pixel of the subject of the same position in the plurality of subject images.

X-ray imaging device

A radiation phase contrast imaging device includes an X-ray source, an X-ray detector configured to detect radiated X-rays, a plurality of gratings, an image processor configured to generate a reconstructed image from an X-ray image acquired from the X-ray detector, a display, and a controller configured or programmed to perform control to display, on the display, the X-ray image before reconstruction and the reconstructed image generated by the image processor.

Radiation phase contrast imaging device

This X-ray phase image capturing system () includes an X-ray source (), a plurality of gratings, and a detector (), a moving mechanism (), and an image processing unit (). The image processing unit () is configured to generate a phase-contrast image () based on a plurality of feature quantities () and feature quantitiesextracted from a plurality of X-ray image sets (R) acquired by performing fringe scanning a plurality of times in a short time.

X-ray phase image capturing system

This X-ray imaging apparatus () includes a rotation mechanism () for relatively rotating an imaging system () constituted by an X-ray source (), a detector (), a first grating () and a second grating (), and an image processing unit () for generating a dark-field image based on an X-ray intensity distribution at each of a plurality of rotation angles. The image processing unit () is configured to perform a scattering correction for reducing a dark-field signal of a pixel whose dark-field signal is larger than a threshold value (V) among a plurality of pieces of pixels in the dark-field image to a set value (V).

X-ray imaging apparatus

A phase contrast X-ray imaging system includes an X-ray source; a plurality of gratings; a detector; a grating movement mechanism; and an image processor that generates a phase contrast image. The image processor generates the phase contrast image by using a pitch of an intensity change and a function which has the pitch as a variable and expresses the intensity change in a pixel value as a grating moves.

Phase contrast X-ray imaging system

The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.

This X-ray phase difference imaging system () includes an X-ray source (), a plurality of gratings, a detector (), and an image processor (), in which the image processor () is configured to correct an artifact of a second phase contrast image () that is reconstructed by using a first X-ray image () and a third X-ray image (), on the basis of a first phase contrast image () that is reconstructed by using the first X-ray image () and a second X-ray image ().

X-ray phase difference imaging system and phase contrast image correction method

Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase gratingprovided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase gratingis observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase gratingand the absorption grating, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating, and the absorption gratingfrom the image of the reference area.

X-ray phase contrast imaging apparatus

The X-ray imaging apparatus is provided with a plurality of gratings including an X-ray source and a first grating, a detector, a grating rotation mechanism for rotating a plurality of gratings respectively, and an image processor for generating at least a dark field image. The image processor is configured to generate a dark field image captured by arranging the grating at a plurality of angles in a plane orthogonal to the optical axis direction.

This X-ray phase contrast imaging apparatus () includes an X-ray source () that radiates continuous X-rays, a first grating () that forms a self-image, a second grating (), a detector () that detects the continuous X-rays, and a third grating () arranged between the detector () and the first grating. The first grating (), the second grating (), and the third grating () are arranged so as to satisfy conditions of predetermined formulas.

The radiation phase contrast imaging apparatus includes an X-ray source, a first grating, a second grating arranged between the X-ray source and the first grating, and a moving mechanism for moving an object stage for holding an object. The moving mechanism is configured to more the object stage to an X-ray source side of the first grating and a second grating side of the first grating opposite to the source side of the first grating.

Radiation phase contrast imaging apparatus

An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit and an arrangement pitch of phase shift sections related to a phase grating. A positional relationship among the multi-slit, the phase grating, and an FPD is determined based on the arrangement pitch of the slits related to the multi-slit, the arrangement pitch of the phase shift sections related to the phase grating, and an arrangement pitch of detection elements related to the FPD. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections, the present invention can change the positional relationship among the multi-slit, the phase grating, and the FPD.

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Kyoto, Japan

Kenji Kimura