Matsushita Electric Industrial Co., Ltd.

Shimadzu Corporation

Nec Corporation

Nippon Steel Corporation

Kanegafuchi Chemical Industry Co., Ltd.

Seisan Kaihatsu Kagaku Kenkyusho

Tdk Corporation

Ube Industries, Inc.

Tosoh Corporation

Toyo Boseki Kabushiki Kaisha

Nippon Mining Co., Ltd.

Kenji Iijima

Masayoshi Hiramoto

Hiroshi Sakakima

Akihiro Odagawa

Nozomu Matsukawa

Nozomu Matukawa

Hideaki Adachi

Osamu Inoue

Koichi Kugimiya

Toshio Takada

Takahito Terashima

Kazunuki Yamamoto

Kazuto Hirata

Mitsuo Satomi

Yasunari Sugita

Takashi Nishikawa

Yoshichika Bando

Yoshihiro Tomita

Hiroshi Kagata

Ryoichi Takayama

Junichi Kato

Kojiro Okuyama

Takayuki Takeuchi

Yasuhiro Kawawake

Ichiro Ueda

Toshifumi Satoh

Hirotaka Furukawa

A magnetic body inspection device () is provided with a detection unit () including a differential coil () and a detection signal acquisition unit (). The differential coil () has at least a first receiving coil () formed of a planar coil and a second receiving coil () formed of a planar coil, the first receiving coil and the second receiving coil being differentially connected. The first receiving coil () and the second receiving coil () are arranged so that detection surfaces thereof are opposed to each other with a magnetic body (W) interposed therebetween.

Magnetic body inspection device and magnetic body inspection system

A magnetic body inspection apparatus includes a magnetic field application unit configured to apply a magnetic field to a long material including a magnetic body to be inspected, a detector configured to excite, in a longitudinal direction of the long material, magnetization of the magnetic body, the detector being configured to acquire a detection signal based on the magnetic field of the magnetic body that has been excited, and a detection apparatus body including the magnetic field application unit and the detector, the detection apparatus body being configured to be attachable to the long material in a short-side direction of the long material.

Magnetic body inspection apparatus

The magnetic material inspection device includes: a differential coil configured to detect a change in a magnetic field of a magnetic material and transmit a differential signal, the differential coil including a pair of receiving coils; a detection coil configured to detect the change in the magnetic field of the magnetic material and transmit a detection signal; and a controller configured to detect a state of the magnetic material based on the differential signal of the differential coil and detect the state of the magnetic material based on the detection signal of the detection coil.

Magnetic material inspection device

A magnetic body inspection device () is a magnetic body inspection device for inspecting states of a plurality of magnetic bodies (W) by a total magnetic flux method that measures a magnetic flux inside the magnetic body (W). The device includes a plurality of detection coils () each for detecting the magnetic field of each of the magnetic bodies (W), an excitation unit () provided for the plurality of magnetic bodies (W), and a detection signal output unit () for outputting a detection signal based on the magnetic field of each of the magnetic bodies (W).

Magnetic body inspection device

A magnetic body inspection system includes a processing unit for extracting a feature amount from a measured damage waveform and determining the type of damage to a magnetic body based on a comparison between the extracted feature amount and a feature amount stored in advance in a storage unit.

Magnetic material inspection system, magnetic material inspection device, and magnetic material inspection method

A magnetic body inspection device () is provided with a magnetic field application unit () configured to apply a magnetic field to a magnetic body (W) to be inspected in advance to rectify the magnitude and orientation of magnetization in the magnetic body (W), and a detection unit () configured to output a detection signal based on the magnetic field in the magnetic body to which the magnetic field application unit has been applied or a change in the magnetic field. The magnetic application unit includes magnets () arranged such that pole faces (Pf) of the same polarity are opposed to each other on both sides of the magnetic body.

Magnetic body inspection device and magnetic body inspection method

A wire rope inspection device () includes a controllerconfigured or programmed to detect a state of a wire rope (W) based on a difference at substantially a same position between a first detection signal acquired by a differential coil () in a first measurement and a second detection signal acquired by the differential coil in a second measurement after the first measurement.

Wire rope inspection device, wire rope inspection system, and wire rope inspection method

This magnetic body inspection apparatus () includes a magnetic field application unit () configured to apply a magnetic field in advance to a steel wire rope (W) and to adjust a magnetization direction of the steel wire rope (W), and is configured to detect a magnetic field change by a detector ().

Magnetic body inspection apparatus and magnetic body inspection method

The present invention provides a vertical current-type magneto-resistive element. The element includes an intermediate layer and a pair of magnetic layers sandwiching the intermediate layer, and at least one of a free magnetic layer and a pinned magnetic layer is a multilayer film including at least one non-magnetic layer and magnetic layers sandwiching the non-magnetic layer. The element area defined by the area of the intermediate layer through which current flows perpendicular to the film is not larger than 1000 &#x3bc;m.

Magneto-resistive element

The present invention provides a magnetoresistive element that includes a pair of magnetic layers and an intermediate layer between the magnetic layers. The intermediate layer contains at least three elements selected from Groups 2 to 17, and the elements include at least one selected from the group consisting of F, O, N, C and B. According to the invention, a magnetoresistive element with high magnetoresistance change ratio and low resistance can be provided. The invention also provides a method for producing a magnetoresistive element. The method includes forming a precursor and forming at least one part of the intermediate layer from the precursor. The precursor is reacted with at least one reactive species selected from the group consisting of oxygen atoms, nitrogen atoms and carbon atoms in a reactive atmosphere containing the reactive species.

Magnetoresistive element and method for producing the same

The present invention provides a magnetic head having improved characteristics, using a magnetoresistive device in which current flows across the film plane such as a TMR device. In a first magnetic head of the present invention, when the area of a non-magnetic layer is defined as a device cross-section area, and the area of a yoke is defined as a yoke area, viewed along the direction perpendicular to the surface of the substrate over which the yoke and the magnetoresistive device are formed, then the device cross-section area is not less than 30% of the yoke area, so that a resistance increase of the device cross-section area is suppressed. In a second magnetic head of the present invention, a magnetoresistive device is formed on a substrate, and a yoke is provided above a non-magnetic layer constituting the device. In a third magnetic head of the present invention, the free layer of the magnetoresistive device includes at least two magnetic films and at least one non-magnetic film that are laminated alternately, and the thickness of the non-magnetic layer is not less than 2 nm and not more than 10 nm, and magnetostatic coupling is dominant. In a fourth magnetic head of the present invention, a magnetic gap is provided adjacent to the magnetoresistive device and the magnetic films are coupled antiferromagnetically.

Magnetic head with yoke and multiple magnetic layers

Magnetic head comprising a multilayer magnetoresistive device and a yoke for introducing magnetic flux from a medium to the magnetoresistive device

After an underlying layer, made of a single crystal metal material, has been formed on a semiconductor layer, part or all of the underlying layer is changed into a metal oxide layer by supplying oxygen thereto from above the underlying layer. Then, a ferroelectric or high-dielectric-constant film is further formed on the metal oxide layer. Since the film made of a metal material is formed on the semiconductor layer, a silicon dioxide film or the like is not formed easily. Thus, a dielectric film, which includes an underlying layer with a high dielectric constant and has a large capacitance per unit area, can be obtained. Various defects such as interface states in the semiconductor layer can also be reduced advantageously if these process steps are performed after a thermal oxide film has been formed on the semiconductor layer.

Dielectric film and method for forming the same

A magnetic head including a magnetic substrate for operating as a first electrode, a multi-layer film formed on a portion of the surface of the magnetic substrate an inter-layer insulating layer provided to cover side surfaces of the multi-layer film, a flux guide formed on surfaces of the multi-layer film and inter-layer insulating layers, a non-magnetic conductive layer formed on a surface of the flux guide, and a second electrode formed on a surface of the non-magnetic conductive layer, in which the multi-layer film includes a first magnetic layer formed on a portion of the surface of the magnetic substrate and includes a fixed layer, and a second magnetic layer including a non-magnetic layer formed on a surface of the first magnetic layer and a free layer formed on a surface of the non-magnetic layer.

Magneto-resistive element, magnetic head, and magnetic recording and reproduction apparatus

Growing community of inventors

Kyoto, Japan

Kenji Iijima