Kabushiki Kaisha Toshiba

Toshiba Medical Systems Corporation

Canon Medical Systems Corporation

Kenji Hirohata

Junichiro Ooga

Yasuko Fujisawa

Satoshi Wakai

Shigeo Kaminaga

Kazumasa Arakita

Hideaki Ishii

Takuma Igarashi

Minoru Mukai

Tomoko Monda

Takahiro Omori

Akihiro Goryu

Mitsuaki Kato

Akira Kano

Katsumi Hisano

Takeichiro Nishikawa

Tomonao Takamatsu

Minoru Yonezawa

Shinya Higashi

Minoru Nakatsugawa

Chie Morita

Takuya Sakaguchi

Hideo Kitamura

Yousuke Hisakuni

Takuya Hongo

Akihiro Koga

Tomoyuki Suzuki

Yoshihiro Ikeda

Toshikatsu Akiba

Tetsuya Kugimiya

Fumio Ishiyama

Kazuyo Narita

Kenji Ooki

Takashi Kawakami

Yuu Yamayose

Yuki Numata

Tomoya Fumikura

Katsuaki Hiraoka

There is provided a medical image processing apparatus which includes a first extraction unit configured to extract coronary arteries depicted in images of a plurality of time phases relating to the heart, and to extract at least one stenosed part depicted in each coronary artery; a calculation unit configured to calculate a pressure gradient of each of the extracted coronary arteries, based on tissue blood flow volumes of the coronary arteries; a second extraction unit configured to extract an ischemic region depicted in the images; and a specifying unit configured to specify a responsible blood vessel of the ischemic region by referring to a dominance map, in which each of the extracted coronary arteries and a dominance territory are associated, for the extracted ischemic region, and to specify a responsible stenosis, based on the pressure gradient corresponding to a stenosed part in the specified responsible blood vessel.

Medical image processing apparatus and medical image processing method

An information processing system according to an embodiment includes edge terminals, an information processing apparatus, and one or more service providing apparatuses. The edge terminals each transmit, to the information processing apparatus, monitoring data indicating a state of a target system to be analyzed. The information processing apparatus performs an analysis process by using an analysis model that inputs an input value including the monitoring data transmitted from the edge terminals and outputs an output value of a value function. The analysis process is a process to obtain the output value in response to the input value. The information processing apparatus transmits, to the service providing apparatuses, information indicating an analysis result of the analysis process. The service providing apparatuses each output information obtained by visualizing the analysis result on the basis of information indicating the analysis result.

Information processing system, information processing method, and computer program product

A semiconductor deviceincludes a pair of electrodesand a conductive connection memberelectrically bonded to the pair of electrodes. At least a portion of a perimeter of a bonding surfaceof at least one of the pair of electrodesand the conductive connection memberincludes an electromigration reducing area

Semiconductor device and inspection device

A control apparatus according to an embodiment includes one or more hardware processors. The processors acquire, for each of elements, pieces of input data representing first physical field of a corresponding one of the elements at a first time point. The elements are obtained by discretization of an object to be controlled. The processors calculate, for each element, second physical field of a corresponding element at a second time point after the first time point. The second physical field is calculated based on a value of an energy functional representing energy of the corresponding element. The value of the energy functional is obtained by inputting the pieces of input data into an estimation model. The processors control the object such that control quantity based on the second physical field becomes a target value.

Control apparatus, control method, and computer program product

According to one embodiment, a medical image diagnostic apparatus includes a storage memory, processing circuitry, and a display. The storage memory stores data of a plurality of FFR distribution maps constituting a time series regarding a coronary artery, and data of a plurality of morphological images corresponding to the time series. The processing circuitry converts the plurality of FFR distribution maps into a plurality of corresponding color maps, respectively. The display displays a plurality of superposed images obtained by superposing the plurality of color maps and the plurality of morphological images respectively corresponding in phase to the plurality of color maps. The display restricts display targets for the plurality of color maps based on the plurality of FFR distribution maps or the plurality of morphological images.

Medical image diagnostic apparatus

A time-series morphology index and a time-series shape deformation index of the analysis target region on a time-series medical image are calculated by image processing. A dynamical model of a structural fluid analysis of the analysis target region is temporarily structured, based on the time-series morphology index, the time-series shape deformation index, and the time-series medical image. A latent variable of the identification region is identified so that at least one of a prediction value of a blood vessel morphology index and a blood flow volume index based on the temporarily structured dynamical model match with at least one of an observation value of the blood vessel morphology index and the blood flow volume index measured.

Blood vessel analysis apparatus, medical image diagnosis apparatus, and blood vessel analysis method

According to one embodiment an electronic apparatus includes a housing, a heat generating element, a plurality of sensors, and an index calculator. The heat generating element is housed in the housing. The index calculator calculates an index corresponding to a physical quantity or an index indicating performance of the electronic apparatus, based on a correlation between detected values of the sensors and the index.

Electronic apparatus, index calculating method, and computer program product

A semiconductor device inspection apparatus according to embodiments comprises: an action unit that generates an internal stress in a predetermined direction in a semiconductor device; a stress controller that controls a magnitude of the internal stress generated in the semiconductor device by the action unit; a probe electrically connected to the semiconductor device; a probe controller that supplies a current to the semiconductor device via the probe; and a controller that screens the semiconductor device based on a first current flowing through the semiconductor device via the probe while the internal stress is not generated in the semiconductor device and a second current flowing through the semiconductor device via the probe while the action unit generates the internal stress in the semiconductor device.

Semiconductor device inspection apparatus, semiconductor device inspection method, program thereof, semiconductor apparatus, and manufacturing method therefor

A medical image diagnostic apparatus according to an embodiment includes an estimation unit, an extraction unit, and a specifying unit. The estimation unit estimates a position of a plaque in a blood vessel based on data of CT images constituting a time series, with the blood vessel being enhanced by a contrast medium. The extraction unit extracts regions constituting the blood vessel from the CT images. The specifying unit specifies stress values respectively corresponding to the regions based on a moving displacement due to cardiac pulsation in each of the regions, and specifies an exfoliation risk of the plaque based on an index indicating hardness of the plaque and the stress value in the region corresponding to the position of the plaque.

An inspection device comprises: a detecting unit that is connected to a plurality of semiconductor chips having mutually different rates of change of electrical resistance with respect to stress loading direction, and that detects an electrical resistance value of each semiconductor chip from electric current flowing in each semiconductor chip; a first memory unit that is used to hold model data meant for converting an electrical resistance value into a characteristic value indicating at least either temperature, or stress, or strain; a converting unit that converts the electrical resistance value of each semiconductor chip as detected by the detecting unit into the characteristic value using the model data held in the first memory unit; and a second memory unit that is used to store the characteristic value, which is obtained by conversion by the converting unit, as time-series data for each of the plurality of semiconductor chips.

Inspection device, inspection system, intelligent power module, inspection method, and computer program product

A semiconductor storage device comprises a plurality of memory cells arranged in a matrix. Each of the memory cells includes: a semiconductor storage element including a silicon carbide substrate and a silicon carbide film on a first surface of the silicon carbide substrate; a lower electrode on a second surface facing away from the first surface of the silicon carbide substrate; and an upper electrode on at least part of a surface of the silicon carbide film, the surface facing away from another surface of the silicon carbide film in contact with the silicon carbide substrate. Each memory cell includes at least one basal plane dislocation formed at at least part of the semiconductor storage element.

Semiconductor storage device, method of controlling semiconductor storage device, computer program product, and method of fabricating semiconductor storage device

A medical-information processing apparatus according to an embodiment includes processing circuitry. The processing circuitry acquires medical image data that is obtained during imaging on the subject in a resting state in the time phase where the relationship between the volume of blood flow and the pressure in a blood vessel in the cardiac cycle of the subject indicates a proportional relationship. The processing circuitry extracts the structure of a blood vessel, included in the medical image data, applies fluid analysis to the structure of the blood vessel to obtain a first index value, which is obtained based on the pressure in the blood vessel on the upstream side of a predetermined position within the blood vessel and the relation equation between the volume of blood flow and the pressure in the blood vessel in the resting state, and a second index value, which is obtained based on the pressure in the blood vessel on the downstream side of the predetermined position and the relation equation, and calculates the pressure ratio, which is the ratio of the first index value to the second index value.

Medical-information processing apparatus and X-ray CT apparatus

According to an embodiment, in a semiconductor device, a total value of a change amount of chemical potential of the semiconductor device with respect to a expansion direction of a stacking fault and the stacking fault energy of the stacking fault is zero or more.

Semiconductor device and method of manufacturing semiconductor device

A semiconductor device comprises a semiconductor chip and a mounting substrate. The semiconductor chip has an element structure including: a silicon carbide substrate that has a hexagonal crystal structure; a gate electrode that is disposed on a part above a first surface corresponding to a (0001) plane or a (000-1) plane of the silicon carbide substrate; an insulating film that is interposed between the silicon carbide substrate and the gate electrode; and a source and a drain that are disposed with respect to the silicon carbide substrate and the gate electrode such that at least a part of a channel through which a carrier moves extends in a &#x3c;1-100&#x3e; direction of crystal orientation of the silicon carbide substrate. The mounting substrate is fixed with the semiconductor chip such that compressive stress in a &#x3c;11-20&#x3e; direction of crystal orientation of the silicon carbide substrate is applied to the semiconductor chip at least in operation.

Growing community of inventors

Tokyo, Japan

Kenji Hirohata