Fuji Electric Co., Ltd.

Kenichiro Sato

Tadahiko Sato

Soichi Yoshida

A semiconductor apparatus includes a first connection terminal and a second connection terminal, a drive circuit including one or more power semiconductor elements, a control circuit to control the one or more power semiconductor elements, a circuit substrate, a passive element on the circuit substrate, and a first bus bar and a second bus bar. The first bus bar includes a first body including a path electrically connecting the first connection terminal to the drive circuit, and a first protrusion protruding toward the circuit substrate against the first body. The second bus bar includes a second body including a path electrically connecting the second connection terminal and the drive circuit, and a second protrusion protruding toward the circuit substrate against the second body. The passive element is electrically connected to the first protrusion and to the second protrusion.

Semiconductor apparatus

A semiconductor module includes a multilayer substrate having a main wiring layer formed therein, a main current flowing in the main wiring layer when the semiconductor device is turned on, a first and second semiconductor elements, each of which has a top electrode on a top surface thereof and a bottom electrode on a bottom surface thereof, and is disposed on a top surface of the main wiring layer to which the bottom electrode is conductively connected, a metal plate having an end portion, a bottom surface of the end portion being conductively connected to the top electrode of the first semiconductor element, and a control board including an insulating plate disposed on the top surface of the end portion and a control wiring layer disposed on a top surface of the insulating plate for controlling turning on and off of the first and second semiconductor elements.

Semiconductor module

A semiconductor device that can detect temperature appropriately is provided. A semiconductor device provided with a semiconductor substrate in which one or more transistor portions and one or more diode portions are provided is provided, including: a temperature detecting portion provided above the top surface of the semiconductor substrate and having a longitudinal side in a predetermined longitudinal direction; a top surface electrode provided above the top surface of the semiconductor substrate; and one or more external lines that have a connecting part connected with the top surface electrode and electrically connect the top surface electrode to a circuit outside the semiconductor device. The temperature detecting portion extends across the one or more transistor portions and the one or more diode portions in the longitudinal direction, and the connecting part of at least one of the external lines is arranged around the temperature detecting portion when seen from above.

Semiconductor device, semiconductor package, semiconductor module, and semiconductor circuit device

A semiconductor module, including a metal-oxide-semiconductor field effect transistor (MOSFET) made of a SiC semiconductor material, and an insulated gate bipolar transistor (IGBT) that is made of a Si semiconductor material and is connected in parallel with the MOSFET. The MOSFET having a body diode. The IGBT is a reverse conductive-IGBT (RC-IGBT), and includes a free wheeling diode. A forward voltage of the free wheeling diode is so set that a current in the body diode of the MOSFET, which is connected in parallel with the RC-IGBT, is equal to or below a current value that causes lattice defects to grow in the MOSFET.

A semiconductor device, including a control circuit that has a gate control circuit driving a power semiconductor element. The control circuit further includes a plurality of alarm detection circuits respectively detecting a plurality of abnormalities, a protection circuit stopping the gate control circuit responsive to the detection of any abnormality, an alarm signal generation circuit generating an alarm signal responsive to the detected abnormality, a warning detection circuit detecting a warning before any of the abnormalities is detected, and a pulse generation circuit generating a warning signal while the warning is being detected. The alarm signal is a one-shot pulse having a pulse width thereof corresponding to the detected abnormality, such that alarm signals generated responsive to different abnormalities have different pulse widths. The warning signal includes a plurality of successive pulses, each of which has a pulse width smaller than any of the pulse widths of the alarm signals.

Semiconductor device

A semiconductor device is provided, which includes: a semiconductor substrate; an emitter electrode including at least two partial electrodes arranged with an interval in a top plan view of the semiconductor substrate; and an active-side gate runner and an active-side dummy runner arranged to be sandwiched between two of the partial electrodes, wherein the semiconductor substrate includes: a gate trench portion connected to the active-side gate runner and having a longitudinal length in a first direction in the top plan view, and a dummy trench portion connected to the active-side dummy runner and having a longitudinal length in the first direction, wherein the entirety of one of the active-side gate runner and the active-side dummy runner in the first direction is covered by the other of the gate runner and the dummy runner.

A method of manufacturing a semiconductor device that includes an insulated circuit board having a conductive pattern, a first semiconductor chip with a rectangular shape connected through a first joining material to the conductive pattern, a second semiconductor chip with a rectangular shape disposed on the conductive pattern separated from the first semiconductor chip and connected through a second joining material to the conductive pattern, a terminal disposed above the semiconductor chips, respectively connected to the first and second semiconductor chips through third and fourth joining materials, the terminal having a through-hole above a place between the first and second semiconductor chips, the method including a positioning step in which the first and second semiconductor chips are respectively positioned at at least three positioning places, and at least one of the positioning places is positioned with a positioning member inserted into the through-hole.

Method of manufacturing a semiconductor device

A semiconductor device includes a heat dissipating unit that includes a primary part made of a first metal material and an embedded part that is embedded in a front surface of the primary part and that is made of a second metal material, a front surface of the heat dissipating unit having a mounting region on which a rear surface of a semiconductor element substrate is mounted so as to dissipate heat generated by the semiconductor element; and a sealing member that seals the semiconductor element, the substrate, and a sealed region of the front surface of the heat dissipating unit, wherein the embedded part is formed in the sealed region, and an absolute difference of the linear expansion coefficient of the second metal material and that of the sealing member is less than or equal to 25% of a value of the linear expansion coefficient of the sealing member.

A semiconductor device has a plurality of small-sized semiconductor chips disposed between an insulated circuit board having a conductive pattern and a terminal. The semiconductor device exhibits a high accuracy in positioning the semiconductor chips. The semiconductor device includes an insulated circuit board having a conductive pattern, a first semiconductor chip with a rectangular shape connected to the conductive pattern through a first joining material, a second semiconductor chip with a rectangular shape, disposed on the conductive pattern separated from the first semiconductor chip and connected to the conductive pattern through a second joining material, and a terminal disposed above the first semiconductor chip and the second semiconductor chip, connected to the first semiconductor chip through a third joining material, and connected to the second semiconductor chip through a fourth joining material. The terminal has a through-hole above a place between the first semiconductor chip and the second semiconductor chip.

Semiconductor device, method of manufacturing a semiconductor device, and positioning jig

A method for manufacturing a semiconductor module includes the step of soldering two or more semiconductor elements having substrate materials and heights different from each other to a metal foil disposed at one side of an insulating substrate; connecting a plurality of wiring members, not interconnecting the semiconductor elements, to front face electrodes of the semiconductor elements through solder so that heights from a surface of the insulating substrate to top faces of the wiring members become same level with each other; inspecting a leakage current while applying electricity on each one of semiconductor elements individually through the wiring members; and connecting the top faces of the wiring members with a bus bar.

Method for manufacturing semiconductor module and intermediate assembly unit of the same

A semiconductor unit of certain aspects of the invention includes electrically conductive plates in the shape of the letter L, each consisting of a horizontally disposed leg portion and a vertically disposed flat body portion that is perpendicular to a cooling plate adhered to the bottom of the semiconductor unit. A pair of the vertically disposed flat body portions sandwiches a semiconductor chip. Owing to this construction, the heat generated in the semiconductor chip can be conducted away through the both surfaces of the chip, thus improving cooling performance. Since the heat is conducted away through the leg portions of the L-shaped electrically conductive plates a projected planar area occupied by the cooling plate required for cooling the semiconductor unit is reduced. Therefore, the size of the semiconductor unit can be reduced.

Semiconductor unit having a power semiconductor and semiconductor apparatus using the same

A semiconductor apparatus according to embodiments of the invention can include a first semiconductor device made of silicon, the first semiconductor devices being arranged collectively, whereby to form a first device group, and a second semiconductor device made of silicon carbide, the second semiconductor devices being arranged collectively, whereby to form a second device group. The apparatus can also include a wiring conductor connecting the first semiconductor device and the second semiconductor device, a cooling fin base comprising a projection formed thereon, whereby to dissipate heat generated from the first and second semiconductor devices, and the projections arranged under the second device group being spaced apart from each other more widely than the projections arranged under the first device group.

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Shiojiri, Japan

Kenichiro Sato