Hitachi-high-technologies Corporation

Kenichi Yagi

Takayuki Noda

Masashi Akutsu

Yoshimitsu Takagi

Kenichi Takahashi

Kenji Teshigawara

Atsushi Suzuki

Hitoshi Ohtake

A determination mechanism which obtains information about the weight of the specimen housed in the specimen container is arranged on a conveyor line for connecting between a loading module and an automatic centrifugal unit, the specimens are held without being installed at an adaptor until the number of the specimens which can be subjected to a centrifugal processing at once by the automatic centrifugal unit arrives, and the specimens are installed after the arrival in an order from a heavier specimen at the adaptors to be paired, which are installed at the symmetric positions to each other across the rotation central axis. Also, the specimen is installed at the gravity-center position of the adaptor first, and the subsequent specimens are installed from the inner side at the point-symmetric positions to each other across the gravity-center position.

Automatic centrifuge, pre-analysis system with automatic centrifuge and the control techniques of that system

A method for an automatic analyzer to reduce a user's workload required when a reagent is placed therein, and thereby facilitating change of the operation mode of the automatic analyzer. The automatic analyzer including a first reagent storing unit that is capable of storing a plurality of reagent cassettes and a second reagent storing unit that is capable of storing a plurality of reagent cassettes. When the first reagent storing unit does not have empty space for a required reagent, and all reagents required for analysis operation for a selected operation set cannot be completely transferred to the first reagent storing unit, keeping the required reagent waiting in the second reagent storing unit. Further, when the first reagent storing unit is provided with empty space, the required reagent is transferred to the first reagent storing unit.

Automatic analyzer and method for using the same

An automatic analysis system, which is capable of quickly performing reinspection, includes a sample rack which holds a sample vessel containing a sample; a sample rack input unit in which the sample rack is input; a carrier line which carries the sample rack; a plurality of automatic analyzers arranged along the carrier line; a sample rack holding unit which holds the sample rack storing an analyzed sample; a sample rack collection unit which collects the sample rack storing an analyzed sample; a carrier line for reinspection which returns the sample rack containing a sample subjected to reinspection depending on analysis results; and a controller for returning the sample rack from the sample rack holding unit through the carrier line for reinspection and controlling any one of automatic analyzers different from one that has previously performed analysis to perform reanalysis of the sample.

Automatic analyzer

Growing community of inventors

Mito, Japan

Kenichi Yagi