Renesas Electronics Corporation

Kenichi Ushikoshi

Hironori Nakamura

Tsuyoshi Hirakawa

Takayuki Kurokawa

Noriaki Komatsu

Tatsuya Ishizaki

Nobutoshi Tsunesada

A semiconductor integrated circuit device includes a first chip that is directly accessible from outside, a second chip that transmits and receives data to and from the first chip, the second chip being not directly accessible from outside, and a through circuit that is provided in the first chip and transmits first and second test signals input from an external device to the second chip, wherein the through circuit includes a first signal transmission path to generate a first signal by synchronizing the first test signal to a clock signal input from the external device and to output it to the second chip and a second signal transmission path to generate a second signal by synchronizing the second test signal to a test clock signal input from the external device and to output it to the second chip.

Semiconductor integrated circuit device and method of testing same

A semiconductor memory device for storing data defining a multidimensional space based on coordinate information of the data, includes: a cell array having memory cells arranged in a lattice pattern, for storing the data; a word line selector selecting and driving any one of a plurality of word lines which activate memory cells arranged in a row direction; write amplifiers/sense amplifiers writing/reading data to/from the memory cells arranged in a column direction; an amplifier selector inputting/outputting the data to/from the selected one of the write amplifiers/sense amplifiers; and an address conversion circuit generating a row address to be supplied to the word line selector based on the coordinate information of the data, and to generate a column address to be supplied to the amplifier selector by converting the coordinate information of the data into one-dimensional information.

Semiconductor memory device and data storage method including address conversion circuit to convert coordinate information of data into one-dimensional information to amplifier

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Kanagawa, Japan

Kenichi Ushikoshi