Hitachi, Ltd.

Hitachi-High-Technologies Corporation

Kenichi Shinbo

Fujio Oonishi

Ritsuro Orihashi

Yasushi Terui

Kouichi Uesaka

Tsukasa Shishika

Masashi Fukuzaki

Nobuo Motoki

Masami Makuuchi

Ritsurou Orihashi

For the achievement of data transfer time reduction, removal of noise data, and analytical efficiency improvement in an ADC data processing function of a time-of-flight mass spectrometer, the mass spectrometer comprises a data acquisition circuit including: an A/D converter; a signal intensity addition memory that stores data of ion signals such as a time range and the number of measurements and performs an addition process; a voltage value frequency addition memory that performs an addition process of frequencies of voltage values of the predetermined time range and the number of measurements and stores addition results; a threshold level computation circuit that computes a predetermined threshold level from the results in the memory; a compression memory that extracts only data exceeding the threshold level from the data in the signal intensity addition memory; and a counter that controls a measurement time for data acquisition and the operation of each circuit.

Method and apparatus for mass spectrometry

In a data acquisition system of ADC system, a log amplifier is provided at the pre-stage of an A/D converter, a signal amplified by the log amplifier having a nonlinear input-output characteristic is A/D-converted, and an adding operation of data is performed while reconverting a voltage value data which is converted to a nonlinear characteristic to data with a linear scale according to a table memory for reverse-log conversion. A known voltage value is inputted into the log amplifier to perform measurement, and calibration of the table memory is performed by storing the voltage value and the voltage value data after A/D-converted.

Data acquisition system

The present invention relates to a data processing device for mass spectrometry, in which measurements are performed in a high dynamic range without causing an overrange in an A/D converter in any TOF scan. A data acquisition circuit of a mass spectrometer includes an amplitude value computing circuit which measures and stores a maximum amplitude value of an ion detection signal, a gain control circuit for determining and setting a gain amount for the next measurement, and others. From the immediately preceding TOF scan data or TOF scan data plural times before, the maximum amplitude value of the ion detection signal is extracted. Then, before the next TOF scan, an optimum gain amount is determined based on the extracted maximum amplitude value to adjust the gain of the input signal, and the ion signal is sampled in the A/D converter.

Method and its apparatus for mass spectrometry

Multiple monopole antennas or loop antennas for generating electromagnetic fields whose phases become opposite to the phase of an electromagnetic field that the conventional single monopole antenna or loop antenna generates are located in proximity to the conventional single monopole antenna or loop antenna such that the components of the electromagnetic field in directions other than a probe-desired direction will be cancelled out.

Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probe

A pulse generation circuit including a pulse formation circuit for generating normal and dummy pulses according to second delay value data, a data calculation circuit for calculating first delay value data at a timing at which the pulses are generated from the pulse formation circuit according to pattern data having information for determining whether to generate pulses from the pulse formation circuit, a dummy pulse control circuit for controlling generation of a dummy pulse in a no-pulse-generation cycle from the pulse formation circuit according to the second delay value data obtained by detecting the no-pulse-generation cycle from the first delay value data, and a logical gate circuit for eliminating the dummy pulses generated from the pulse formation circuit.

Pulse generation circuit and semiconductor tester that uses the pulse generation circuit

In an odd side storage circuit, logical values of a decision subject signal HCMP are stored in first and second FFs respectively at decision edges LH and HL generated from odd-numbered edges of a decision edge EH. Logical values of a delayed decision subject signal HCMP&prime; are stored in third and fourth FFs. According to a selection signal generated by a selection signal generation circuit based on outputs of the third and fourth FFs, a first selector selects an output of the first or second FF. An even side storage circuit operates similarly at even-numbered edges. A second selector selects the odd and even side storage circuits alternately. The FFs in the odd and even side storage circuits are reset by a decision edge LH&prime; of the even side and the decision edge HL of the odd side, respectively.

Test apparatus

An electromagnetic wave source detecting apparatus may include a plurality of probes for measuring intensities of an electric field or magnetic field generated from an object to be measured at each measuring position. Calculation means may calculate a phase difference or time difference between electric fields or magnetic fields associated with the probes from the electric field or magnetic field intensities measured by the individual plural probes. A position of an electromagnetic wave source existing in the measured object may be calculated and identified by using the phase difference or time difference thus calculated. A magnitude of a current existing in the electromagnetic wave source at the position thus calculated may be identified on the basis of the electric field or magnetic field intensities thus measured.

Apparatus and method for detecting electromagnetic wave source, and method for analyzing the same

There are provided electromagnetic wave source detecting apparatus and method as well as electromagnetic wave source analyzing system and method which can detect and analyze a source of (electromagnetic disturbing wave) representing a main factor in generating an electromagnetic field remotely of the apparatus in order to suppress the electromagnetic field intensity at the remote distance from the apparatus to below a regulated value. In the present invention, a magnetic field near an object to be measured is measured by a set of at least two or more probes and , a position of an electromagnetic wave source is detected through simplified calculation of one function using a phase difference between the two probes, a current distribution on the measured object is determined by solving simultaneous equations containing the position information and magnitudes of measured magnetic fields and an electromagnetic field at a remote distance from the apparatus is determined from the current distribution, thereby identifying the source representing the main factor in generating the electromagnetic field remotely of the apparatus.

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Yokohama, Japan

Kenichi Shinbo