Fuji Photo Optical Co., Ltd.

Texas Instruments Corporation

Hitachi Denshi Kabushiki Kaisha

Kenichi Noguchi

Shigenori Ohi

Masane Suzuki

Shigeo Mizukawa

Motonori Kanaya

Kenji Yasuda

Masami Yoneda

Hiroshi Shibamoto

Yoshiaki Nagaya

Yukio Kondou

Hisashi Itoh

An image pickup device providing favorable images which effectively suppress the interference stripe noise originating in the interference stripes created on an image sensor surface of the image pickup device. The image pickup device includes an image sensor 3 and an overlying lid glass 2. By providing a prescribed inclination angle with respect to the relative position of the image sensor 3 and the lid glass 2 protecting it, the same number of interference stripes are provided with respect to each constitutional image-defining element within the image sensor 3, and prevention of interference stripe noise is achieved by leveling the average light intensity each constitutional image-defining element receives so that sensitizing of interference stripe noise does not occur at the specific elements.

Image pickup device with attached interference stripe noise prevention

Disclosed herein is an interferometric surface inspection machine which is arranged to facilitate the inspection of finished spherical lens surfaces, and which essentially includes: a surface plate formed with a through light guide opening in a predetermined position; an up-down guide means suspended from the lower side of the surface plate; an interferometer liftably supported on the up-down guide means and having a reference lens with a reference surface thereof disposed on the side of the light guide opening and in face to face relation with said light guide opening; and a lens mount portion adjustably located in a predetermined position above the light guide opening in the surface plate and adapted to support peripheral edge portions of a spherical lens element on the side of the lens surface to be inspected.

Interferometric surface inspection machine designed to support an

A laser interferometer for inspecting the surface condition of a specimen by irradiating the specimen on a specimen support mechanism with a laser beam projected thereto through a reference plate, and observing the interference fringe produced by interference between reflected light from a reference surface of the reference plate and a surface of the specimen under inspection, the laser interferometer includes: an interferometer housing accommodating therein an optical laser beam guide member and an optical interference fringe imaging member, and is provided with a laser beam guide portion in a wall portion thereof; a laser tube mount member of a cylindrical form projected on the outer side of the housing and positioned in such a manner so as to circumvent the laser guide portion; and a laser tube detachably fitted in the laser tube mount member.

Laser interferometer for inspecting the surface of a specimen

Growing community of inventors

Omiya, Japan

Kenichi Noguchi