Jasco Corporation

Kenichi Akao

Jun Koshoubu

Toshiyuki Nagoshi

Noriaki Soga

Tetsuji Sunami

Koshi Nagamori

Seiichi Kashiwabara

Yuji Higuchi

Tsubasa Asatsuma

Masaaki Yumoto

Yoshiko Akao

Hiroshi Mineo

Kohei Tamura

Miyuki Kanno

A spectrometer capable of providing information, to a measurer, necessary for determining whether a sample set to the spectrometer is a sample expected by the measurer or not before a main measurement includes a data processor and a display. The data processor calculates a preliminary spectral information of the sample based on at least n of a latest detected signal and a BKG information retained in advance, calculates and updates the preliminary spectral information based on at least n of the latest detected signal and the BKG information again, and repeats these calculations and updates. The display shows the preliminary spectral information that is calculated and updated in the preview display. The data processor starts integration of N (N>n) of the detected signal during a preview display of the preliminary spectral information, and acquires a spectral information of the sample.

Spectrometer

The present invention relates to an improvement in spectral analysis in spectrometry, particularly in a technique of spectral analysis by spectral classification at high speed. A spectral analysis devicecomprises: a measurement unitthat measures a sample spectrum of a target sample; and an analysis unitthat analyses the sample spectrum, and analyses a compound contained in the target sample, wherein

Real-time spectral analysis through high-speed spectral classification

A microscopic-measurement apparatus capable of displaying, on a display device, an enlarged view of a particular part of a specimen placed on a movable stage and providing optical information of a desired portion includes an observation-image display section for displaying an enlarged view of a specific part of the specimen on the display device; a thumbnail-image display section for acquiring the enlarged image of the specific part as a thumbnail image when the enlarged observation image is specified and displaying the thumbnail image together with the enlarged image on the display device; a thumbnail-coordinate storage section for storing coordinate information of the specific part, where the thumbnail image is acquired, in association with the thumbnail image; and a thumbnail jump display section for causing the observation-image display section to display an enlarged image of the position of the thumbnail image by specifying the thumbnail image.

Microscopic-measurement apparatus

A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system. The microscopic-measurement apparatus for acquiring optical information from desired portions of a sample by moving a measuring optical axis on a surface of the sample includes an observation-image display section for displaying a sample surface image as an observation image, in a range of visual field which is observable at a present sample position; an optical-axis display section for displaying areas to be measured and a present position of the measuring optical axis in an overlapped state with the observation image; an area setting section capable of setting measuring areas by expanding, reducing, changing in shape and moving the areas to be measured; and an optical-information acquisition section for measuring one set measuring area or several set measuring areas successively with an instruction of starting measurement.

A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.

Noise-component removing method

An irreversible-reaction measurement method comprising: a step in which a perturbation is applied to one of the divided portions of a measurement sample placed in a light path of a Fourier-transform spectrophotometer to cause an irreversible-reaction while a mirror of the spectrophotometer remains at a data point; a step in which interferogram is detected from the sample portion placed in the path at predetermined time intervals after the application of the perturbation; a step in which the mirror moves to and remains at the next data point after the reaction of the sample portion reaches an end point; a step in which the sample portion placed in the light path is changed to the next sample portion each time the mirror moves to the next data point; and a step in which the irreversible-reaction of the measurement sample is analyzed in accordance with the interferogram obtained by repeating the steps.

Irreversible-reaction measurement method

It is an object of the present invention to provide a mapping-data analyzing method that can display a map in which sufficient information is extracted from the spectra of obtained mapping data to enable objective analysis. The mapping-data analyzing method of the present invention is used for analyzing mapping data obtained by measuring, with a spectrometer apparatus, spectra at a plurality of points on a specimen surface. The method comprises a principal-component calculating step and a grouped-map display step. In the principal-component calculating step, spectral data obtained at each point on the specimen surface is defined as an individual sample and principal component analysis, in which values at a plurality of wave numbers of each spectral data set serve as variables, is performed to calculate the scores of a plurality of principal components for each individual sample. In the grouped-map display step, the points on the specimen surface are divided into a plurality of groups based on the scores of a plurality of principal components calculated in the principal-component calculating step and a two-dimensional or three-dimensional map indicating to which group each point on the specimen surface belongs is displayed on a display device.

Mapping-data analyzing method and apparatus

A high-sensitivity reflection measurement apparatus disposed in an optical path between a light emitter and a detector of an analysis apparatus comprises an incident-side optical element, which bends the optical path of measurement light emitted from the light emitter such that the angle of incidence of the measurement light so emitted with respect to a sample surface under measurement ranges from 70&#xb0; inclusive to 90&#xb0; exclusive with respect to the direction perpendicular to the sample surface under measurement. The measurement light is transmitted as linearly polarized light having a desired oscillation direction, and is incident on the sample surface under measurement. Information related to the measured sample surface is obtained from light reflected from the measured sample surface when the linearly polarized light from the incident-side optical element is incident on the sample surface.

High-sensitivity reflection measurement apparatus

The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy. An infrared circular dichroism measuring apparatuscomprising: AC signal extractorswhere an interference light beam from an IR light sourcewhich has passed an interferometeris converted into a clockwise and a counterclockwise circularly polarized light beams and is irradiated on a sample to extract from a detected signal of detectoran interferogram by each of the circularly polarized light beams; DC signal extractorsfor extracting an interferogram by the IR absorption of the sample; a calculatorfor figuring out the circular dichroism; and a selective transmitterfor narrowing down the wavelength region to be measured based on an IR absorption wavelength region corresponding to a vibration mode of the structure to be measured in the sample molecule.

Growing community of inventors

Hachioji, Japan

Kenichi Akao