The Furukawa Electric Co., Ltd.

National Institute of Advanced Industrial Science and Technology

Nippon Steel Corporation

Kengo Nakao

Masakazu Matsui

Hajime Kasahara

Toshiya Kumagai

Takaaki Manabe

Mitsugu Sohma

Norio Matsui

Naoto Edo

Hirokazu Sasaki

Masahiro Rikiso

Hidetaka Yamashita

Hideto Nakamura

Katsumi Hirano

Akifumi Nakajima

Sumio Kachi

Tomohiro Nakayama

Weiming Zhou

An electric power network includes: a plurality of power routers each including a plurality of power ports; a plurality of interconnection lines configured to connect the power routers in a grid manner via the power ports; and an electric power apparatus configured to consume or supply electric power, the electric power apparatus being connected to a power port that is included in at least one of the power routers and that is not connected to any of the interconnection lines. At least one of the power ports of each of the power routers is set as a dependent port for which characteristics of direct-current power to be input or output are not controlled.

Electric power network and method of changing electric power network

A superconducting oxide thin film includes a superconducting layer formed on a supporting material. The superconducting layer includes an RE-based superconductor as a main component, and the RE-based superconductor includes a CuO chain that has a Cu vacancy portion.

Superconducting oxide thin film

An oxide superconducting thin film includes a substrate, and an intermediate layer and a superconducting layer provided in this order on the substrate. The intermediate layer has an average thickness of from 10 nm to 20 nm and a surface roughness Ra of 0.5 nm or less. The superconducting layer is formed on a surface of the intermediate layer and includes an oxide superconductor as a main component. A superconducting fault current limiter including the oxide superconducting thin film is also provided.

Oxide superconductor thin film and superconducting fault current limiter

An oxide superconducting thin film includes a substrate having a single crystal structure, the main face of the substrate and a crystal face of the single crystal structure having an angle therebetween; an intermediate layer formed on the main face of the substrate and having an axis oriented in a direction perpendicular to the crystal face; and a superconducting layer formed on the intermediate layer and containing, as a main component, an oxide superconductor having a c-axis oriented in a direction perpendicular to the surface of the intermediate layer. A superconducting fault current limiter and a method of manufacturing an oxide superconducting thin film are also provided.

Oxide superconductor thin film, superconducting fault current limiter, and method for manufacturing oxide superconductor thin film

A dimension measurement system is provided. The dimension measurement system includes a speech I/O device fit in an ear canal of a worker, generating a voice signal from vibration in the air emitted from an eardrum of the worker and propagated inside the ear canal, and outputting the voice signal and an information processing device realizing a speech recognition function recognizing a measurement value of a dimension of an object from the voice signal that the speech I/O device output and a judgment function judging if the measurement value satisfies a reference value of the object.

Dimension measurement system

Growing community of inventors

Tokyo, Japan

Kengo Nakao