Asahi Glass Company, Limited

Ken Uemura

Tsunehiro Saito

Satoshi Yoshida

Tetsuo Miyake

Yoshiichi Ozeki

Shinji Yamamura

Kazuaki Shimizu

Takao Kurita

Yasunari Saito

Hiroshi Takamuku

Yukiko Nagashima

Shigeki Takano

Koji Abematsu

A calculation method for physical value for calculating physical values in a numerical analysis method for numerically analyzing a physical phenomenon, comprises a physical value calculation step of calculating physical values in an analysis domain divided into a plurality of divided domains, wherein in the physical value calculation step, the physical values are calculated by using: a discretized governing equation that uses values not requiring coordinates (Vertex) of vertices of the divided domains and connectivity information (Connectivity) of the vertices and that is derived on the basis of a weighted residual method; and a calculation data model in which volumes of the divided domains and characteristic values of boundary surface indicating characteristics of boundary surfaces of adjacent ones of the divided domains are provided as the values not requiring coordinates (Vertex) of vertices of the divided domains and connectivity information (Connectivity) of the vertices.

Calculation method for physical value, numerical analysis method, calculation program for physical value, numerical analysis program, calculation device for physical value, and numerical analysis device

A method for storing time series data comprising storing short period data at an arbitrary sampling period and storing long period data at a sampling period longer than the arbitrary sampling period, in which the time series data are stored in a hierarchically correlated manner. Even when a great amount of data are stored, processes such as reading out, transferring, and displaying requisite data can be efficiently executed at high speed.

Method for storing time series data and time series database system, method and system for processing time series data, time series data display system, and recording medium

A method of measuring a distortion of a transmitting beam, characterized in that a transmitting beam is emitted from a beam generator and projected onto a screen as a bright spot, the bright spot is scanned over a surface of the screen, and a distortion of the transmitting beam is measured on the basis of a distance between a first location of the bright spot on the screen at a first time when the transmitting beam is incident on a beam receiving device in a specified incident direction upon transmitting through a measured body, and a second location of the bright spot on the screen at a second time when the transmitting beam is incident on the beam receiving device in the specified incident direction upon not transmitting through the measured body. A surface shape of a three-dimensional object may also be measured on the basis of a distance between a first location of the bright spot on the screen at a first time when the transmitting beam is incident on a beam receiving device in a specified incident direction upon being reflected from a surface of a three-dimensional measured body, and a second location of the bright spot on the screen at a second time when the transmitting beam is incident on the beam receiving device in the specified incident direction upon being reflected from a surface of a reference body. The present invention provides measurements having improved accuracy for objects of any size irrespective of the resolution of the beam receiving device.

Method and device for measuring distortion of a transmitting beam or a

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Tokyo, Japan

Ken Uemura