Omron Corporation

Keizo Tanaka

Haruna Shimakawa

Katsushige Ohnuki

Provided are a failure prediction support device, a failure prediction support method, and a failure prediction support program, by which a user can easily know an abnormality in time series data relating to an apparatus. The failure prediction support device includes: a difference detection part, acquiring actual machine time series data being time series data relating to control of an apparatus and simulation time series data being time series data relating to control of the simulated apparatus, and detecting a difference between the actual machine time series data and the simulation time series data; a determination part, determining whether or not the difference satisfies a condition predetermined in relation to an abnormality in the actual machine time series data; and a notification processing part, notifying that the difference has been detected when it is determined that the difference satisfies the condition.

Growing community of inventors

Kyoto, Japan

Keizo Tanaka