Growing community of inventors

Endicott, NY, United States of America

Keith K Ho

Average Co-Inventor Count = 9.78

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 364

Keith K HoChi Shih Chang (2 patents)Keith K HoSubahu Dhirubhai Desai (2 patents)Keith K HoRobert A Martone (2 patents)Keith K HoPhillip A Hartley (2 patents)Keith K HoScott A Versprille (2 patents)Keith K HoRobert D Schoening (2 patents)Keith K HoLouis J Shaffer (2 patents)Keith K HoRoy T Mulcahy (2 patents)Keith K HoDebra A Gernhart (2 patents)Keith K HoRobert J Haskins, Jr (2 patents)Keith K HoRosemary DeSantis Paradis (1 patent)Keith K HoStanley Philip Cason (1 patent)Keith K HoHope Eleanor Miller (1 patent)Keith K HoEric Woisard (1 patent)Keith K HoMichael Wayne Gearing (1 patent)Keith K HoKaren Marie D'Andria (1 patent)Keith K HoMerwin John Barrett (1 patent)Keith K HoKeith K Ho (3 patents)Chi Shih ChangChi Shih Chang (18 patents)Subahu Dhirubhai DesaiSubahu Dhirubhai Desai (13 patents)Robert A MartoneRobert A Martone (4 patents)Phillip A HartleyPhillip A Hartley (3 patents)Scott A VersprilleScott A Versprille (2 patents)Robert D SchoeningRobert D Schoening (2 patents)Louis J ShafferLouis J Shaffer (2 patents)Roy T MulcahyRoy T Mulcahy (2 patents)Debra A GernhartDebra A Gernhart (2 patents)Robert J Haskins, JrRobert J Haskins, Jr (2 patents)Rosemary DeSantis ParadisRosemary DeSantis Paradis (12 patents)Stanley Philip CasonStanley Philip Cason (7 patents)Hope Eleanor MillerHope Eleanor Miller (1 patent)Eric WoisardEric Woisard (1 patent)Michael Wayne GearingMichael Wayne Gearing (1 patent)Karen Marie D'AndriaKaren Marie D'Andria (1 patent)Merwin John BarrettMerwin John Barrett (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (3 from 164,221 patents)


3 patents:

1. 6029144 - Compliance-to-policy detection method and system

2. 5546321 - Method and apparatus for the cross-sectional design of multi-layer

3. 5519633 - Method and apparatus for the cross-sectional design of multi-layer

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