Surclean, Inc.

Coherent, Inc.

Laser Mechanisms, Inc.

Keith Jefferies

Donald Sprentall

Gerald Francis Hermann

Daniel R Buckley

Christopher R D Miller

Apparatus for distance gauging in laser material processing includes a source of laser-radiation, an electrically-conductive focusing assembly, a constant-current source, and a voltmeter. The focusing assembly focuses laser-radiation towards an electrically conductive workpiece being processed. The focusing assembly and the workpiece form a capacitive sensor. The constant current source provides a constant electrical current to the focusing assembly for a constant time. The focusing assembly and the workpiece are separated by a distance that is proportional to a change in voltage measured on the focusing assembly during the constant time.

Laser material processing distance gauge

A first source of radiation generates a first radiation to remove a coating from a component. An amount of the first radiation generated by the first source of radiation depends on an amount of power supplied to the first source of radiation. A controller receives feedback regarding removal of the coating from the component by the first radiation and regarding the amount of power supplied to the first source of radiation, and adjusts the amount of power supplied to the first source of radiation based on the feedback. A second source of radiation generates a second radiation capable of detecting whether the coating is encountered again. The controller restarts the first source of radiation to generate the first radiation in response to the coating being detected by the second radiation, and sets the amount of power supplied to the first source of radiation based on the feedback.

System and method for coating removal using radiation

A removal system is configured for removing a coating from a substrate of a component. A first and second energy source are each configured to direct electromagnetic radiation onto the component the electromagnetic radiation produces a respective first and second property. A sensor detects the first and second properties produced by the first and second stream of electromagnetic radiation. A controller is configured to receive the detected first and second property from the sensor and the associated first and second power levels from the respective first and second energy sources. The controller transmits an updated power level to at least one of the first and second energy sources in response to the first and second property received from the sensor and the associated power level received from the first and second energy sources.

System configured for removing a coating from a substrate using electromagnetic radiation

The high speed, high accuracy capacitive gauging system employs an oscillator fed through steep slope filter that is discriminates between very small changes in capacitance even in the presence of electrical noise. During intervals when the probe tip is retracted, the oscillator frequency is calibrated to match the sweet spot in the center of the linear operative region of the steep slope filter. This calibrates the system to overcome the effects of varying temperature and humidity in the manufacturing environment.

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New Hudson, MI, United States of America

Keith Jefferies