Nxp Usa, Inc.

Keith Jackoski

Ronghua Zhu

Pierre Turpin

Maarten Jacobus Swanenberg

Alaa Eldin Y El Sherif

Arif Alam

Matthew Bacchi

Laurent Segarra

Ruchika Pandya

Bo Wu

Russell Schaller

Neal G Baltz

A testing method and apparatus is disclosed for testing an integrated circuit device () which has a dedicated ground bias pad () connected across a high voltage electrostatic discharge clamp circuit () to a well-driving ground pad () by applying a first voltage to the dedicated ground bias pad to bias a wafer substrate () while simultaneously applying a second voltage to the well-driving ground pad to bias the well region (), where the first and second voltage create a stressing voltage across a buried insulator layer () in the integrated circuit device so that a screening test can be conducted to screen for a defect () in the buried insulator layer by measuring a leakage current.

Screening method and apparatus for detecting deep trench isolation and SOI defects

A method and system are provided for supplying power with an LDO linear voltage regulator () having an LDO power supply () and a load switch () by connecting a power supply voltage () to a main core () and a standby core () in a multi-core low power microcontroller () during an active mode so that the standby core receives a first supply voltage that tracks the power supply voltage during the active mode, and upon detecting a standby mode for the multi-core low power microcontroller, disconnecting the power supply voltage from the standby core and connecting a low dropout (LDO) linear power supply voltage to the standby core during the standby mode so that the standby core receives the LDO linear power supply voltage as a second supply voltage during the standby mode.

Adaptive and efficient standby power supply scheme for next generation low power automotive systems

A method for switching a power supply for low current standby operation includes deactivating a first supply connected to a first supply node, in response to activating an enable signal. A second supply is changed to a low power mode in response to activating the enable signal, wherein the second supply is connected to a second supply node. The first supply node is connected to the second supply node in response to a first voltage of the first supply node being less than or equal to a positive offset above a second voltage of the second supply node. The first supply node is disconnected from the second supply node in response to deactivating the enable signal, wherein the first supply node is disconnected at a rate preventing the first supply node from discharging below a first supply minimum voltage.

Method and apparatus to switch power supply for low current standby operation

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Chandler, AZ, United States of America

Keith Jackoski