Bwxt Nuclear Operations Group, Inc.

Bwxt Nog Technologies, Inc.

Keith B Rider

Aaron C Havener

James D Jogerst

Thomas C Mohr

Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.

Apparatus and method for inspection of a film on a substrate

A method and apparatus are provided for determining an isotopic property of a sample mass including placing a sample mass on a solid state detector exposing the solid state detector to a neutron flux. The solid state detector is configured to receive fluorescence damage in response to interaction with a fission product produced from fission of at least a portion of the sample mass. The method also including exposing the solid state detector to a light source, measuring the light emissions of the fluorescence damage, and determining an isotopic property of the sample mass based on the light emissions of the fluorescence damage.

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Prospect, VA, United States of America

Keith B Rider