Brillnics Singapore Pte. Ltd.

Nf Holdings Corporation

Keita Murase

Takahiro Matsuzawa

Shingo Sobukawa

Takehito Kamimura

Naoyuki Abe

Shinichiro Matsuo

Shingo Sanada

A solid-state imaging device, a method for driving a solid-state imaging device, and an electronic apparatus are provided that are capable of reducing memory circuits of a column reading system, so that the column reading system can achieve a reduced layout area and eventually a reduced size. A column reading circuit includes an AD converting part and a calculating part. The AD converting part is configured to analog-to-digital convert a read-out reset signal and a read-out signal of a pixel signal read to a vertical signal line into an n-bit digital pixel signal. The calculating part includes an n-bit asynchronous counter including a retention circuit with a control logic function, which is configured to obtain a difference between an n-bit read-out reset signal and an n-bit read-out signal produced by the AD conversion performed by the AD converting part.

Solid-state imaging device, method for driving solid-state imaging device, and electronic apparatus

A capacitance measuring circuit measures an electrostatic capacitance formed between a first conductor that receive an AC signal and a second conductor. The capacitance measuring circuit includes an amplifier including an input and an output; signal detection means including a negative feedback unit that has a feedback capacitance and applies a negative feedback from an output of the amplifier to an input of the amplifier, wherein an input of the amplifier is connected to the second conductor and is virtually grounded by the negative feedback unit and an AC signal of an amplitude in a functional relation with the electrostatic capacitance is output; and measuring means that is connected to an output of the signal detection means and has a function of measuring at least an amplitude of an AC signal output of the signal detection means.

Capacitance measuring circuit and electrostatic capacitive displacement meter

Growing community of inventors

Tokyo, Japan

Keita Murase