Ishida Co. Limited

Keisuke Yoshida

Futoshi Yurugi

Ken Iwakawa

An X-ray inspection apparatus includes: a transport unit configured to transport an article; an X-ray source configured to irradiate the article with X-rays; an X-ray detection unit configured to detect the X-rays using a photon counting method and to classify photon energy of the detected X-rays into two or more energy regions on the basis of a threshold value; a threshold value setting unit configured to set the threshold value; an X-ray image generation unit configured to generate two or more X-ray transmission images corresponding to the two or more energy regions on the basis of a detection result of the X-rays; and an inspection unit configured to inspect the article on the basis of the X-rays. The threshold value setting unit is configured to set the threshold value on the basis of gradations of the two or more X-ray transmission images.

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Ritto, Japan

Keisuke Yoshida