Tdk Corporation

Keisuke Takasugi

Naoki Ohta

Kenzo Makino

Akira Furuya

Hiromichi Umehara

Kenji Inage

Hiroshi Take

Takehiro Isoda

Hiraku Hirabayashi

Masanori Sakai

Toshiyuki Yoshizawa

Masahiro Miyazaki

Masaomi Ishikura

A magnetic field detection apparatus includes a substrate, first and second projections, first and second MR films, and first and second wiring lines. The first and second projections are provided on a flat surface of the substrate and each include first and second inclined surfaces. The first and second MR films are provided on the first and second inclined surfaces, respectively. The first wiring line couples the first MR film on the first inclined surface of the first projection and the first MR film on the first inclined surface of the second projection to each other. The second wiring line couples the second MR film on the second inclined surface of the first projection and the second MR film on the second inclined surface of the second projection to each other. The first and second wiring lines intersect on the first inclined surface, the second inclined surface, or both.

Magnetic field detection apparatus

A magnetic sensor used to detect a detection target substance in a sample includes a substrate having a first surface and a second surface, which is opposite the first surface and a magnetoresistive effect element provided on the first surface of the substrate. The resistance of the magnetoresistive effect element changes in accordance with an input magnetic field. A protective layer covers the top of the magnetoresistive effect element. The surface of the protective layer, which is positioned on top of the magnetoresistive effect element, has a prescribed surface roughness.

Magnetic sensor and method of manufacturing such, and magnetic detection device and magnetic detection system

A magnetic sensor includes an insulating layer including a flat portion and a protruding portion, a first MR element, and a second MR element. The protruding portion includes a first inclined surface and a second inclined surface. The first MR element is disposed on the first inclined surface. The second MR element is disposed on the second inclined surface. The protruding portion extends in a first direction parallel to a top surface of a substrate, and includes a plurality of recess portions each recessed in a direction parallel to the top surface of the substrate at an end of the protruding portion in the first direction.

Sensor

A magnetic sensor includes a first insulating layer, a second insulating layer, a third insulating layer, a lower coil element located on an opposite side of the first insulating layer from the second insulating layer, and a second MR element. The second MR element includes a magnetization pinned layer and a free layer. The magnetization pinned layer and the free layer are located on an opposite side of the third insulating layer from the second insulating layer. The first and third insulating layers each contain a first insulating material. The second insulating layer contains a second insulating material.

Sensor including a plurality of insulating layers made of different insulating materials

A magnetic field detection apparatus includes first and second projections that are provided on a flat surface of a substrate and that each include first and second inclined surfaces. First and second MR films are provided on the first and second inclined surfaces, respectively. A first wiring line couples the first MR films provided on the respective first inclined surfaces of the first and second projections. A second wiring line couples the second MR films provided on the respective second inclined surfaces of the first and second projections. The first and second projections are adjacent in a first direction, with the first inclined surface of the first projection and the second inclined surface of the second projection opposed to each other in the first direction. One or more patterns are provided on the first inclined surface of the first projection, the second inclined surface of the second projection, or both.

Sensor having at least part of sensor element disposed on inclined surface of protruding portion of support member

A magnetic sensor used to detect detection substances in samples includes a substrate having a first surface and a second surface, which is opposite to the first surface, a magnetoresistance effect element, which is provided on the first surface and in which the resistance of the magnetoresistance effect element changes in accordance with an input magnetic field, and a protective layer that covers the magnetoresistance effect element. The magnetoresistance effect element is configured in a line shape extending in a first direction on the first surface, and has a first region that is positioned at the outer periphery in a plan view, and a second region that is surrounded by the first region. The height of a top surface of the protective layer on the first region is greater than the height of a top surface of the protective layer on the second region.

Magnetic sensor, detection device and detection system

A magnetic sensor includes a substrate having a first surface and a second surface, which is opposite the first surface, and a detection unit provided on the first surface. The detection unit includes a magnetoresistive effect element, the resistance value of which changes in accordance with an input magnetic field, provided on the first surface, and a protective layer that covers at least the magnetoresistive effect element. The magnetoresistive effect element is configured in a linear shape extending in a first direction on the first surface. The detection unit has a first width, which is a length in a second direction, orthogonal to the first direction, and a second length, which is greater than the first width. The first width is the length of the detection unit on the first surface, and the second width is the length of the top surface of the detection unit.

Magnetic sensor, magnetic detection device and magnetic detection system

A magnetic sensor that ensures the height of the yoke and that guides magnetic flux in the direction in which the magnetic field sensing film detects a magnetic field includes a first magnetic field detection element that has a first magnetic field sensing film that detects a magnetic field in a first direction, and a first yoke that includes a first portion that is located on a side of the first magnetic field sensing film with respect to the first direction, and a second portion that is in contact with the first portion in a direction that is orthogonal to the first direction. The average dimension of the second portion in the first direction is larger than the average dimension of the first portion in the first direction.

Magnetic sensor and method of manufacturing the same

A magnetic sensor having a yoke that can achieve large magnetic flux density and that can be accurately formed is provided. The magnetic sensor includes magnetic field detection elementthat detects a magnetic field in first direction X and first yokethat is located near magnetic field detection elementand extends in second direction Z that is orthogonal to first direction X. First yokeincludes first portionthat is located away from magnetic field detection elementat least in first direction X and second portionthat is located farther away from magnetic field detection elementthan first portionwith respect to second direction Z. The second portionhas surfacethat is opposite to interfacewith the first portion, surfacehaving a curved shape that protrudes in a direction away from the first portion

A magnetic sensor that is easy to ensure the height of the yoke and that is also easy to guide magnetic flux in the direction in which the magnetic field sensing film detects a magnetic field is provided. The magnetic sensor includes first magnetic field detection elementthat has first magnetic field sensing filmthat detects a magnetic field in first direction X, and first yokethat includes first portionthat is located on a side of first magnetic field sensing filmwith respect to first direction X, and second portionthat is in contact with first portionin direction Z that is orthogonal to first direction X. The average dimension of second portionin first direction X is larger than the average dimension of first portionin first direction X.

To provide a thin film capacitor having a device structure for suppressing peeling between an insulating film and a substrate. A thin film capacitorhas a laminate structure that is formed by laminating a lower electrode, a dielectric film, and an upper electrodein sequence on a substrate. An adhesion layeris formed on a side surface of the lower electrodevia the dielectric film, and an insulating filmin contact with the adhesion layercovers the laminate structure. According to this device structure, the adhesion layerhaving excellent adhesiveness to the insulating filmis disposed between the insulating filmand the dielectric film, so that peeling of the insulating filmcan be suppressed.

Thin film capacitor

The present invention provides an electronic component which is capable of effectively suppressing the characteristic deterioration of the passive element portion. An electronic component comprises a ceramic substrate, a passive element portion on the substrate, an insulator layer which is provided over the passive element portion and comprises a through-hole, a lead terminal which is fitted in the through-hole of the insulator layer and electrically connected to the passive element portion, and an external connection terminal which is electrically connected to the lead terminal. The insulator layer comprises a first face on the side of the passive element portion, a second face on the side opposite the passive element portion, and a third face which connects the first face and the second face and constitutes the peripheral face of the insulator layer, the external connection terminal is in contact with the lead terminal and the second face and the third face of the insulator layer. In a cross-section of the through-hole in a thickness direction of the substrate, a boundary line between the internal surface of the through-hole and the lead terminal is inclined in a direction moving away from a region of the third face with which the external connection terminal is in contact with an end of the boundary line on the side of the first face being taken as a fixed point.

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Tokyo, Japan

Keisuke Takasugi