Hitachi High-tech Corporation

Mitsubishi Electric Corporation

Yokogawa Electric Corporation

Hitachi-kokusai Electric Inc.

Waseda University

Keisuke Igarashi

Masashige Suwa

Hiroyuki Chiba

Toshie Yaguchi

Kotaro Ogawa

Keiji Tamura

Hiromi Mise

Hiroshi Kawarada

Wei Chean Tan

Yukihiro Shintani

Kazuo Akaike

Mai Yoshihara

Hideki Aridome

Yuzo Miura

Mohd Sukri Shaili Falina Binti

Yukio Otani

Takuro Naramura

Yasuyuki Nodera

Akiko Wakui

Masafumi Inaba

Toshio Ogawa

Sukri Shaili Falina Binti Mohd

A headlight device is a headlight device for a vehicle, including a light source unit to include a plurality of light-emitting units respectively emitting light having spectral distributions different from each other and to emit illuminating light having a combined spectral distribution as a combination of the spectral distributions of the plurality of light-emitting units, an acquisition unit to acquire environment information indicating a surrounding environment around an illumination region formed by the headlight device, and a control unit to control the spectral distributions of the plurality of light-emitting units based on the environment information acquired by the acquisition unit.

Headlight device

A technique that enables automatic focus adjustment even for a sample having regions with different heights is proposed. A charged particle beam device according to the disclosure includes: a sample holder configured to hold a sample; a sample stage configured to move the sample; a charged particle gun and a charged particle beam column configured to irradiate the sample with a charged particle beam; an objective lens configured to perform focus adjustment by changing an intensity of a focusing effect on the charged particle beam; a detector configured to detect electrons from the sample and output a signal forming an electron image; an optical imaging device configured to capture an optical image of the sample; and a control device configured to calculate height information of the sample based on the optical image obtained by imaging the sample by the optical imaging device, and automatically set a focus adjustment value of an observation site based on the height information (see FIG.).

Charged particle beam apparatus and focus adjusting method therefor

A transmission electron microscope capable of obtaining a hollow-cone dark-field image and visually displaying irradiation conditions thereof includes an irradiation unit for irradiating a specimen with an electron beam, an objective lens for causing the electron beam transmitted through the specimen to form an image, beam deflectors positioned higher than a position where the specimen is placed, an objective movable aperture for passing only a portion of the electron beam transmitted through the specimen, and a deflection coil control unit. The deflection coil control unit controls a deflection angle of the electron beam using the beam deflectors such that the specimen is irradiated with the electron beam at a predetermined angle with respect to an optical axis while the electron beam is moving in a precessional manner and only a diffracted wave and/or a scattered wave having a desired angle passes through the objective movable aperture.

Transmission electron microscope and inspection method using transmission electron microscope

An electronic component includes a field effect transistor that functions as a working electrode of an ion sensor and a driving circuit that causes a potential difference between a source electrode and a drain electrode of the field effect transistor. A reference electrode potential of the field effect transistor is fixed.

Ion sensor, ion concentration measurement method, and electronic component

An article management system generally includes an exit monitoring device, a storage shelf unit and a non-contact id tag. Each of these components are optionally equipped with a detection enhancing device for enhancing the transmission and or reception of signals between the non-contact id tag and the exit monitoring device or between the non-contact id tag and the storage shelf unit. The detection enhancing device includes a loop conductive line or an additional loop antenna.

Enhanced article management system and method

Growing community of inventors

Tokyo, Japan

Keisuke Igarashi